Browsing by imec author "50999a38ef05db4fad12ffb9c25bb108b04a95d3"
Now showing items 41-52 of 52
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On the distribution of oxide defect levels in Al2O3 and HfO2 high-k dielectrics deposited on InGaAs Metal-Oxide-Semiconductor devices studied by Capacitance-Voltage hysteresis
Vais, Abhitosh; Franco, Jacopo; Lin, Dennis; Putcha, Vamsi; Sioncke, Sonja; Mocuta, Anda; Collaert, Nadine; Thean, Aaron; De Meyer, Kristin (2017) -
On the modelling of Border trap admittance in high-K/III-V devices
Vais, Abhitosh (2014) -
On the temperature dependence of frequency dispersion in C-V measurements of III-V MOS devices and its application in spatial profiling of border traps
Vais, Abhitosh; Lin, Dennis; Dou, Chunmeng; Yuan, Yu; Martens, Koen; Ivanov, Tsvetan; Collaert, Nadine; De Meyer, Kristin; Thean, Aaron; Taur, Yuan (2013) -
Record mobility (μeff ~3100 cm²/V-s) and reliability performance (Vov~0.5V for 10yr operation) of In0.53Ga0.47As MOS devices using improved surface preparation and a novel interfacial layer
Vais, Abhitosh; Alian, AliReza; Nyns, Laura; Franco, Jacopo; Sioncke, Sonja; Putcha, Vamsi; Yu, Hao; Mols, Yves; Rooyackers, Rita; Lin, Dennis; Maes, Jan; Xie, Qi; Givens, M.; Tang, F.; Jiang, X.; Mocuta, Anda; Collaert, Nadine; De Meyer, Kristin; Thean, Aaron (2016) -
Reliability challenges of high mobility channel technologies: SiGe, Ge and InGaAs
Franco, Jacopo; Kaczer, Ben; Roussel, Philippe; Cho, Moon Ju; Grasser, Tibor; Arimura, Hiroaki; Cott, Daire; Mitard, Jerome; Witters, Liesbeth; Waldron, Niamh; Zhou, Daisy; Alian, AliReza; Vais, Abhitosh; Lin, Dennis; Martens, Koen; Pourghaderi, Mohammad Ali; Sioncke, Sonja; Collaert, Nadine; Thean, Aaron; Heyns, Marc; Groeseneken, Guido (2014) -
Semiconductor technologies for next generation mobile communications
Collaert, Nadine; Alian, AliReza; Chen, Shih-Hung; Deshpande, Veeresh Vidyadhar; Ingels, Mark; Putcha, Vamsi; Sibaja-Hernandez, Arturo; van Liempd, Barend; Vais, Abhitosh; Vandooren, Anne; Walke, Amey; Witters, Liesbeth; Yu, Hao; Linten, Dimitri; Parvais, Bertrand; Wambacq, Piet; Waldron, Niamh (2018-11) -
Si cap passivation on InGaAs: a route to reduce oxide traps.
Sioncke, Sonja; Nyns, Laura; Vais, Abhitosh; Lin, Dennis; Franco, Jacopo; Bai, Xue; El Kazzi, Salim; Kunert, Bernardette; Porret, Clément; Maurice, Thibaut; Holsteyns, Frank; De Gendt, Stefan; Collaert, Nadine; Heyns, Marc; Thean, Aaron (2014) -
Systematic study of interfacial reactions induced by metal electrodes in high-k/InGaAs gate stacks
Yoshida, Shinichi; Lin, Dennis; Vais, Abhitosh; Alian, AliReza; Franco, Jacopo; El Kazzi, Salim; Mols, Yves; Miyanami, Yuki; Nakazawa, Masashi; Collaert, Nadine; Watanabe, H; Thean, Aaron (2016) -
Temperature dependence of frequency dispersion in III–V metal-oxide-semiconductor C-V and the capture/emission process of border traps
Vais, Abhitosh; Lin, Dennis; Dou, Chunmeng; Martens, Koen; Ivanov, Tsvetan; Xie, Qi; Tang, Fu; Givens, Michael; Maes, Jan; Collaert, Nadine; Raskin, Jean-Pierre; De Meyer, Kristin; Thean, Aaron (2015) -
The relationship between border traps characterized by AC admittance and BTI in III-V MOS devices
Vais, Abhitosh; Martens, Koen; Franco, Jacopo; Lin, Dennis; Alian, AliReza; Roussel, Philippe; Sioncke, Sonja; Collaert, Nadine; Thean, Aaron; Heyns, Marc; Groeseneken, Guido; De Meyer, Kristin (2015) -
The revival of compound semiconductors and how they will change the world in a 5G/6G era
Collaert, Nadine; Alian, AliReza; Banerjee, Aritra; Chauhan, Vikas; ElKashlan, Rana Y.; Hsu, Brent; Ingels, Mark; Vondkar Kodandarama, Komal; Khaled, Ahmad; Kunert, Bernardette; Mols, Yves; Peralagu, Uthayasankaran; Putcha, Vamsi; Rodriguez, Raul; Sibaja-Hernandez, Arturo; Simoen, Eddy; Vais, Abhitosh; Walke, Amey; Witters, Liesbeth; Yadav, Sachin; Yu, Hao; Zhao, Ming; Wambacq, Piet; Parvais, Bertrand; Waldron, Niamh (2020) -
Thermal Modelling of GaN & InP RF Devices with Intrinsic Account for Nanoscale Transport Effects
Vermeersch, Bjorn; Rodriguez, Raul; Sibaja-Hernandez, Arturo; Vais, Abhitosh; Yadav, Sachin; Parvais, Bertrand; Collaert, Nadine (2022)