Browsing by author "Katcki, J."
Now showing items 1-12 of 12
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Accurate extraction of the diffusion line current in silicon p-n junction diodes
Simoen, Eddy; Claeys, Cor; Czerwinski, A.; Katcki, J. (1998) -
Electrical characterisation of shallow cobalt-silicided junctions
Simoen, Eddy; Poyai, Amporn; Claeys, Cor; Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Czerwinski, A.; Katcki, J.; Ratajczak, J.; Gaubas, Eugenijus (2000) -
Electrical characterization of shallow cobalt-silicided junctions
Simoen, Eddy; Poyai, Amporn; Claeys, Cor; Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Czerwinski, A.; Katcki, J.; Ratajczak, J.; Gaubas, Eugenijus (2001) -
Extraction of accurate lifetime and doping profiles in Si p-n junction diodes
Simoen, Eddy; Claeys, Cor; Czerwinski, A.; Tomaszewski, D.; Gibki, J.; Bakowski, A.; Katcki, J. (1997) -
Impact of fast neutron irradiation on the silicon p-n junction leakage and role of the diffusion reverse current
Czerwinski, A.; Katcki, J.; Ratajczak, J.; Simoen, Eddy; Poyai, Amporn; Claeys, Cor; Ohyama, Hidenori (2001) -
Impact of fast-neutron irradiation on the silicon P-N junction leakage and role of the diffusion reverse current
Czerwinski, A.; Katcki, J.; Ratajczak, J.; Simoen, Eddy; Poyai, Amporn; Claeys, Cor; Ohyama, Hidenori (2002) -
Optimised diode analysis of electrical silicon substrate properties
Czerwinski, A.; Tomaszewski, D.; Gibki, J.; Bakowski, A.; Klima, K.; Katcki, J.; Simoen, Eddy; Claeys, Cor (1997) -
Optimised diode assessment of the surface and bulk generation/recombination properties of silicon substrates
Simoen, Eddy; Poyai, Amporn; Claeys, Cor; Czerwinski, A.; Katcki, J. (1998) -
Optimized diode analysis of electrical silicon substrate properties
Czerwinski, A.; Simoen, Eddy; Claeys, Cor; Klima, K.; Tomaszewski, D.; Gibki, J.; Katcki, J. (1998) -
p-n junction diagnostics to determine surface and bulk generation/recombination properties of silicon substrates
Claeys, Cor; Poyai, Amporn; Simoen, Eddy; Czerwinski, A.; Katcki, J. (1999) -
Statistical analysis of shallow p-n junction leakage increase using XTEM results probabilities
Czerwinski, A.; Katcki, J.; Poyai, Amporn; Simoen, Eddy; Claeys, C.; Ratajczak, J.; Gaubas, Eugenijus (2000) -
Statistical analysis of shallow P-N junction leakage increase using XTEM results probabilities
Czerwinski, A.; Katcki, J.; Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Ratajczak, J.; Gaubas, Eugenijus (2001)