Browsing by author "Chintala, Ravi Chandra"

A 3D electrical characterization of single stacking faults in InP by conductive-AFM

Mannarino, Manuel; Celano, Umberto; Lu, Augustin; Chintala, Ravi Chandra; Paredis, Kristof; Vandervorst, Wilfried (2015)

A novel approach of using STM and NC-AFM to study narrow trenches in an oxide matrix

Mannarino, Manuel; Chintala, Ravi Chandra; Eyben, Pierre; Vandervorst, Wilfried (2014)

Characterization of InP growth in nm-sized trenches by a combination of NC-AFM and STM

Mannarino, Manuel; Eyben, Pierre; Chintala, Ravi Chandra; Merckling, Clement; van Dorp, Dennis; Vandervorst, Wilfried (2014)

Characterization of organic materials using scanning probe microscopy techniques

Chintala, Ravi Chandra (2017-05)

Combining UHV AFM and SEM for high resolution, repeatable and low noise scanning spreading resistance microscopy

Eyben, Pierre; Chintala, Ravi Chandra; Mannarino, Manuel; Nazir, Aftab; Schulze, Andreas; Vandervorst, Wilfried (2013)

Damage-free contact mode current sensing SPM: benchmarking PFTUNA vs. C-AFM

Celano, Umberto; Chintala, Ravi Chandra; Hoflijk, Ilse; Moussa, Alain; Vanhaeren, Danielle; Mannarino, Manuel; Nazir, Aftab; Eyben, Pierre; Vandervorst, Wilfried (2013)

Electrical properties of amino SAM layers studied with conductive AFM

Chintala, Ravi Chandra; Eyben, Pierre; Armini, Silvia; Maestre Caro, Arantxa; Loyo Prado, Jana; Sun, Yiting; Vandervorst, Wilfried (2013)

Electrical properties of APTMS SAM layers studied with conductive atomic force microscope

Chintala, Ravi Chandra; Eyben, Pierre; Vandervorst, Wilfried; Armini, Silvia; Sun, Yiting (2012)

Evaluation of the electrical contact area in contact-mode scanning probe microscopy

Celano, Umberto; Hantschel, Thomas; Giammaria, Guido; Chintala, Ravi Chandra; Conard, Thierry; Bender, Hugo; Vandervorst, Wilfried (2015)

Insights into the nanoscale lateral and vertical phase separation in organic bulk heterojunctions via scanning probe microscopy

Chintala, Ravi Chandra; Tait, Jeffrey; Eyben, Pierre; Voroshazi, Eszter; Surana, Supriya; Fleischmann, Claudia; Conard, Thierry; Vandervorst, Wilfried (2016)

Nanoscale 3D characterisation of soft organic material using conductive scanning probe tomography

Chintala, Ravi Chandra; Wood, Sebastian; Blakesley, James C.; Favia, Paola; Celano, Umberto; Paredis, Kristof; Vandervorst, Wilfried; Castro, Fernando A. (2019)

Nanoscale characterization of polymer: fullerene solar cells using peak force tunneling AFM technique

Chintala, Ravi Chandra; Eyben, Pierre; Tait, Jeffrey; Vandervorst, Wilfried (2013)

Sacrificial self-assembled monolayers for the passivation of GaAs (100) surfaces and interfaces

Cuypers, Daniel; Fleischmann, Claudia; van Dorp, Dennis; Brizzi, Simone; Tallarida, Massimo; Müller, Matthias; Hönicke, Philipp; Billen, Arne; Chintala, Ravi Chandra; Conard, Thierry; Schmeisser, Dieter; Vandervorst, Wilfried; Van Elshocht, Sven; Armini, Silvia; De Gendt, Stefan; Adelmann, Christoph (2016)