Browsing by author "Maji, D."
Now showing items 1-4 of 4
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1/f Noise in drain and gate current of MOSFETs with high-k gate stacks
Magnone, P.; Crupi, F.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor; Pantisano, Luigi; Maji, D.; Rao, V.R.; Srinivasan, P. (2009) -
Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique
Maji, D.; Crupi, F.; Magnone, P.; Giusi, G.; Pace, C.; Simoen, Eddy; Rao, V.Ramgopal (2009) -
On the dc and noise properties of the gate current in epitaxial Ge p-channel metal oxide semiconductor field effect transistors with TiN/TaN/HfO2/SiO2 gate stack
Maji, D.; Crupi, F.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor; Rao, V.R. (2008) -
Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs
Maji, D.; Crupi, Felice; Amat, E.; Simoen, Eddy; De Jaeger, Brice; Brunco, David; Manoj, C.R.; Ramgopal Rao, V.; Magnone, P.; Giusi, G.; Pace, C.; Pantisano, Luigi; Mitard, Jerome; Rodríguez, R.; Nafría, M. (2009)