Browsing by author "Cartier, Eduard"
Now showing items 21-35 of 35
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Low Weibull slope of breakdown distributions in high-k layers
Kauerauf, Thomas; Degraeve, Robin; Cartier, Eduard; Soens, Charlotte; Groeseneken, Guido (2001) -
Low Weibull slope of breakdown distributions in high-K layers
Kauerauf, Thomas; Degraeve, Robin; Cartier, Eduard; Soens, Charlotte; Groeseneken, Guido (2002) -
On the electrical characterization of high-kappa dielectrics
Degraeve, Robin; Cartier, Eduard; Kauerauf, Thomas; Carter, Richard; Pantisano, Luigi; Kerber, Andreas; Groeseneken, Guido (2002) -
On the thermal stability of atomic layer deposited TiN as gate electrode in MOS devices
Westlinder, J.; Schram, Tom; Pantisano, Luigi; Cartier, Eduard; Kerber, Andreas; Lujan, Guilherme; Olsson, J.; Groeseneken, Guido (2003) -
On the thermal stability of Atomic Layer Deposition (ALD) TiN as gate electrode in MOS devices
Westlinder, J.; Schram, T.; Pantisano, Luigi; Cartier, Eduard; Kerber, Andreas; Lujan, Guilherme; Groeseneken, Guido (2002) -
Origin of the threshold voltage instability in SiO2/HfO2 dual layer gate dielectrics
Kerber, Andreas; Cartier, Eduard; Pantisano, Luigi; Degraeve, Robin; Kauerauf, Thomas; Kim, Young-Chang; Hou, A.; Groeseneken, Guido; Maes, Herman; Schwalke, U. (2003) -
Passivation and interface state density of SiO2/HfO2-based/polycrystalline-Si gate stacks
Carter, Richard; Cartier, Eduard; Kerber, Andreas; Pantisano, Luigi; Schram, Tom; De Gendt, Stefan; Heyns, Marc (2003) -
Physical characterisation of high-gate stacks
Vandervorst, Wilfried; Bender, Hugo; Conard, Thierry; Richard, Olivier; Zhao, Chao; Brijs, Bert; Caymax, Matty; De Gendt, Stefan; Cosnier, Vincent; Chen, Jerry; Kluth, J.; Cartier, Eduard; Green, Martin (2002) -
Polarity dependent charge trapping in thin SiO2/Al2O3 gate staks with poly-Si gate electrodes: influence of high temperature annealing
Lucci, Luca; Pantisano, Luigi; Cartier, Eduard; Kerber, Andreas; Groeseneken, Guido; Ho, M.Y.; Green, Martin; Selmi, L. (2002) -
Reliability issues in high-k stacks
Degraeve, Robin; Crupi, Felice; Houssa, Michel; Kwak, Dong Hwa; Kerber, Andreas; Cartier, Eduard; Kauerauf, Thomas; Roussel, Philippe; Autran, Jean-Luc; Pourtois, Geoffrey; Pantisano, Luigi; De Gendt, Stefan; Heyns, Marc; Groeseneken, Guido (2004-09) -
Scaling of high-k dielectrics towards sub-1nm EOT
Heyns, Marc; Beckx, Stephan; Bender, Hugo; Blomme, Pieter; Boullart, Werner; Brijs, Bert; Carter, Richard; Caymax, Matty; Claes, Martine; Conard, Thierry; De Gendt, Stefan; Degraeve, Robin; Delabie, Annelies; Deweerd, Wim; Groeseneken, Guido; Henson, Kirklen; Kauerauf, Thomas; Kubicek, Stefan; Lucci, Luca; Lujan, Guilherme; Mentens, Jimmy; Pantisano, Luigi; Petry, Jasmine; Richard, Olivier; Röhr, Erika; Schram, Tom; Vandervorst, Wilfried; Van Doorne, Patrick; Van Elshocht, Sven; Westlinder, Jörgen; Witters, Thomas; Zhao, Chao; Cartier, Eduard; Chen, Jerry; Cosnier, Vincent; Green, Martin; Jang, Se Aug; Kaushik, Vidya; Kerber, Andreas; Kluth, Jon; Lin, Steven; Tsai, Wilman; Young, Edward; Manabe, Yukiko; Shimamoto, Yasuhiro; Bajolet, Philippe; De Witte, Hilde; Maes, Jan; Date, Lucien; Pique, Didier; Coenegrachts, Bart; Vertommen, Johan; Passefort, Sophie (2003) -
Strong correlation between dielectric reliability and charge trapping in SiO2/Al2O3 gate stacks with TiN electrodes
Kerber, Andreas; Cartier, Eduard; Degraeve, Robin; Pantisano, Luigi; Roussel, Philippe; Groeseneken, Guido (2002) -
The influence of defects on campatibility and yield of the HfO2-polysilicon gate stack for CMOS integration
Kaushik, Vidya; De Gendt, Stefan; Carter, Richard; Claes, Martine; Röhr, Erika; Pantisano, Luigi; Kluth, Jon; Kerber, Andreas; Cosnier, Vincent; Cartier, Eduard; Tsai, Wilman; Young, Edward; Green, Martin; Chen, Jerry; Jang, S.A.; Lin, S.; Delabie, Annelies; Van Elshocht, Sven; Manabe, Yukiko; Richard, Olivier; Zhao, Chao; Bender, Hugo; Caymax, Matty; Heyns, Marc (2003) -
Thermal stability and scalability of zr-aluminate-based high-k gate stacks
Chen, Jerry; Cartier, Eduard; Carter, Richard; Kauerauf, Thomas; Zhao, Chao; Pétry, Jasmine; Cosnier, Vincent; Xu, Zhen; Kerber, Andreas; Tsai, Wilman; Young, Edward; Kubicek, Stefan; Caymax, Matty; Vandervorst, Wilfried; De Gendt, Stefan; Heyns, Marc; Copel, M.; Besling, Wim; Bajolet, Philippe; Maes, Jan (2002) -
Towards understanding degradation and breakdown of SiO2/high-k stacks
Kauerauf, Thomas; Degraeve, Robin; Cartier, Eduard; Govoreanu, Bogdan; Blomme, Pieter; Kaczer, Ben; Pantisano, Luigi; Kerber, Andreas; Groeseneken, Guido (2002)