Browsing by author "Poyai, Amporn"
Now showing items 1-20 of 68
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Activation energy analysis as a tool for extraction and investigation of p-n junction leakage current components
Czerwinski, A.; Simoen, Eddy; Poyai, Amporn; Claeys, Cor (2003) -
Analysis of the diffusion currrent in cobalt silicided n+p junctions
Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Gaubas, Eugenijus; Czerwinski, A. (1998) -
Assessment of radiation induced lattice damage in shallow trench isolation diodes irradiated by neutrons
Kobayashi, K.; Ohyama, Hidenori; Hayama, Kiyoteru; Takami, Y.; Simoen, Eddy; Poyai, Amporn; Claeys, C. (2000) -
Current transients in almost-ideal Czochralski silicon p-n junction diodes
Poyai, Amporn; Simoen, Eddy; Claeys, C. (1999) -
Defect assessment in advanced semiconductor materials and devices
Poyai, Amporn (2002-11) -
Defect assessment of irradiated STI diodes
Ohyama, Hidenori; Hayama, Kiyoteru; Miura, T.; Simoen, Eddy; Claeys, Cor; Poyai, Amporn; Nakabayashi, M.; Kobayashi, K. (2001) -
Defect assessment of irradiated STI Diodes
Ohyama, Hidenori; Hayama, Kiyoteru; Miura, T.; Simoen, Eddy; Claeys, Cor; Poyai, Amporn; Nakabayashi, M.; Kobayashi, K. (2002) -
Diode analysis of advanced processing modules for deep-submicrometer CMOS technology nodes
Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Rooyackers, Rita (2003) -
Diode analysis of deep submicron CMOS p-well implantation damage
Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Rooyackers, Rita (2002) -
Diode analysis of high-energy boron implantation-induced P-well defects
Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Rooyackers, Rita; Badenes, Gonçal (2001) -
Diode analysis of silicon substrate quality
Simoen, Eddy; Poyai, Amporn; Claeys, Cor; Czerwinski, A. (1999) -
Diode assessment of material characteristics in internally gettered and non-gettered Czochralski silicon: problems, pitfalls and guidelines
Simoen, Eddy; Poyai, Amporn; Claeys, Cor; Czerwinski, A.; Gaubas, Eugenijus (1998) -
Effect of forward current excess-carrier injection on the diode I-V characteristics
Poyai, Amporn; Simoen, Eddy; Claeys, Cor (2001) -
Effect of shallow junction on the extraction of the minority carrier recombination lifetime from forward diode characteristics
Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Gaubas, Eugenijus (2002) -
Electrical characterisation of shallow cobalt-silicided junctions
Simoen, Eddy; Poyai, Amporn; Claeys, Cor; Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Czerwinski, A.; Katcki, J.; Ratajczak, J.; Gaubas, Eugenijus (2000) -
Electrical characterization of shallow cobalt-silicided junctions
Simoen, Eddy; Poyai, Amporn; Claeys, Cor; Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Czerwinski, A.; Katcki, J.; Ratajczak, J.; Gaubas, Eugenijus (2001) -
Electrical quality assessment of epitaxial wafers based on p-n junction diagnostics
Claeys, C.; Simoen, Eddy; Poyai, Amporn; Czerwinski, A. (1999) -
Extraction of the carrier generation and recombination lifetime from the forward characteristics of advanced diodes
Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Gaubas, Eugenijus; Huber, A.; Gräf, D. (2002) -
Extraction of the carrier generation and recombination lifetime from the forward characteristics of advanced diodes
Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Gaubas, E.; Huber, A.; Gräf, D. (2003) -
Gated-diode study of corner and peripheral leakage current in high-energy neutron irradiated silicon p-n junctions
Czerwinski, A.; Simoen, Eddy; Poyai, Amporn; Claeys, Cor; Ohyama, H. (2003)