Browsing by author "Amat, E."
Now showing items 1-8 of 8
-
Aging mechanisms in strained Si/high-k based pMOS transistors. Implications in CMOS circuits
Martin-Martinez, J.; Amat, E.; Ayala, N.; Bargallo Gonzalez, Mireia; Verheyen, Peter; Rodriguez, R.; Nafria, M.; Aymerich, X.; Simoen, Eddy (2011) -
Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC source/drain
Amat, E.; Rodriguez, R.; Gonzalez, Mario; Martin-Martinez, J.; Nafria, M.; Aymerich, X.; Machkaoutsan, Vladimir; Bauer, M.; Verheyen, Peter; Simoen, Eddy (2010) -
Channel hot-carrier degradation under static stress in short channel transistors with high-k/metal gate stacks
Amat, E.; Kauerauf, Thomas; Degraeve, Robin; De Keersgieter, An; Rodríguez, R.; Nafría, M.; Aymerich, X.; Groeseneken, Guido (2008) -
CHC degradation of strained devices based on SiON and high-k gate dielectric materials
Amat, E.; Rodriguez, R.; Bargallo Gonzalez, Mireia; Martin-Martinez, J.; Nafria, M.; Aymerich, X.; Verheyen, Peter; Simoen, Eddy (2011) -
NBTI related time-dependent variability of mobility and threshold voltage in pMOSFETs and their impact on circuit performance
Ayala, N.; Martin-Martinez, J.; Amat, E.; Bargallo Gonzalez, Mireia; Verheyen, Peter; Rodriguez, R.; Nafria, M.; Simoen, Eddy (2011) -
Processing dependences of channel hot-carrier degradation on strained-S- p-channel metal-oxide semiconductor field-effect transistors
Amat, E.; Martin-Martinez, J.; Bargallo Gonzalez, Mireia; Rodriguez, R.; Nafria, M.; Aymerich, X.; Verheyen, Peter; Simoen, Eddy (2011) -
SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors
Martin-Martinez, J.; Amat, E.; Gonzalez, Mario; Verheyen, Peter; Rooyackers, Rita; Rodriguez, R.; Nafria, M.; Aymerich, X.; Simoen, Eddy (2010) -
Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs
Maji, D.; Crupi, Felice; Amat, E.; Simoen, Eddy; De Jaeger, Brice; Brunco, David; Manoj, C.R.; Ramgopal Rao, V.; Magnone, P.; Giusi, G.; Pace, C.; Pantisano, Luigi; Mitard, Jerome; Rodríguez, R.; Nafría, M. (2009)