Browsing by author "Hirao, T."
Now showing items 1-15 of 15
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A study on radiation damage of IGBTs 2-MeV electrons at different temperatures
Nakabayashi, M.; Ohyama, H.; Hanano, N.; Kamiya, T.; Hirao, T.; Simoen, Eddy; Claeys, Cor (2004) -
A study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperatures
Nakabayashi, M.; Ohyama, H.; Hanano, N.; Kamiya, T.; Hirao, T.; Takakura, K.; Simoen, Eddy; Claeys, Cor (2004) -
A study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperatures
Ohyama, H.; Claeys, Cor; Nakabayashi, H.; Masakazu, T.; Simoen, Eddy; Hanano, M.; Naotika, F.; Hirao, T. (2003) -
Effects of electron irradiation on IGBT devices
Ohyama, H.; Takakura, K.; Nakabayashi, M.; Hirao, T.; Onoda, S.; Kamiya, T.; Simoen, Eddy; Claeys, Cor (2003) -
Effects of high-temperature gamma ray irradiation on npn Si transistors
Ohyama, Hidenori; Hirao, T.; Simoen, Eddy; Claeys, C.; Fukushima, Y.; Tanigawa, A.; Onoda, S. (2001) -
High temperature electron irradiation effects in InGaAs photodiodes
Ohyama, H.; Takakura, K.; Hayama, K.; Hirao, T.; Onoda, S.; Simoen, Eddy; Claeys, Cor (2004) -
High temperature electron irradiation effects in InGaAs photodiodes
Ohyama, H.; Takakura, K.; Hayama, K.; Hirao, T.; Onoda, S.; Simoen, Eddy; Claeys, Cor (2003) -
Impact of lattice defects on the performance degradation of Si photodiodes by high-temperature gamma and electron irradiation
Ohyama, Hidenori; Hirao, T.; Simoen, Eddy; Claeys, C.; Onoda, S.; Takami, Y.; Itoh, H. (2001) -
Induced lattice defects in InGaAsP laser diodes by high-temperature gamma ray irradiation
Ohyama, Hidenori; Hirao, T.; Simoen, Eddy; Claeys, C.; Onoda, S.; Takami, Y.; Itoh, H. (2001) -
Radiation damage in npn Si transistors due to high-temperature gamma-ray and 1-MeV electron irradiation
Ohyama, Hidenori; Hirao, T.; Simoen, Eddy; Claeys, Cor; Nakabayashi, M.; Onoda, S. (2002) -
Radiation damage of InGaAsP laser diodes by high-temperature gamma ray and electron irradiation
Ohyama, Hidenori; Hirao, T.; Simoen, Eddy; Claeys, C.; Kudou, T.; Onoda, S. (2001) -
Radiation damages of polycrystalline silicon films and NPN Si transistors by high-energy particle irradiation
Ohyama, Hidenori; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Tanaka, T.; Hirao, T.; Onada, S.; Kobayashi, K. (2001) -
Radiation damages of polycrystalline silicon films and NPN Si transistors by high-energy particle irradiation
Ohyama, Hidenori; Nakabayashi, M.; Simoen, Eddy; Claeys, C.; Tanaka, T.; Hirao, T.; Onada, S.; Kobayashi, K. (2001) -
Study of electron-irradiated IGBTs by the DCIV method and lifetime
Nakabayashi, M.; Ohyama, H.; Nanao, N.; Hirao, T.; Simoen, Eddy; Claeys, Cor (2004) -
The degradation of the electrical properties of IGBTS by 2-MeV electron irradiation and high-temperature
Nakabayashi, M.; Ohyama, H.; Hanano, N.; Hirao, T.; Simoen, Eddy; Claeys, Cor (2004)