Browsing by author "Woicik, Joseph"
Now showing items 1-4 of 4
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Atomic layer deposited Gd-doped HfO2 thin films: from high-k dielectrics to ferroelectrics
Adelmann, Christoph; Ragnarsson, Lars-Ake; Moussa, Alain; Woicik, Joseph; Mueller, Stefan; Schoeder, Uwe; Afanasiev, Valeri; Van Elshocht, Sven (2012) -
Characterization of chemically vapor deposited manganese barrier layers using X-ray absorption fine structure
Ablett, James; Wilson, Chris; Phuong, Nguyen Mai; Koike, Junichi; Tokei, Zsolt; Sterbinsky, George; Woicik, Joseph (2012) -
Characterization of CVD-Mn barrier layers using X-ray absorption fine structure
Ablett, James; Wilson, Chris; Phuong, Nguyen Mai; Koike, Junichi; Tokei, Zsolt; Sterbinsky, George; Woicik, Joseph (2011) -
Phase identification of self-forming Cu-Mn based diffusion barriers on p-SiOC:H and SiO2 dielectrics using x-ray absorption fine structures
Ablett, James; Woicik, Joseph; Tokei, Zsolt; List, Scott; Dimasi, Elaine (2009)