Browsing by author "Matsuda, S."
Now showing items 1-6 of 6
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Damage coefficient in high-temperature particle- and gamma-irradiated silicon p-i-n diodes
Ohyama, H.; Takakura, K.; Hayama, K.; Kuboyama, S.; Deguchi, Y.; Matsuda, S.; Simoen, Eddy; Claeys, Cor (2003) -
Degradation of the electrical performance and floating body efffects in ultra thin gate oxide FD-SOI nMOSFETs by 2-MeV electron irradiation
Hayama, K.; Rafi, J.M.; Takakura, K.; Ohyama, H.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor; Kuboyama, S.; Oka, K.; Matsuda, S. (2004) -
Radiation damage of Si photodiodes by high-temperature irradiation
Ohyama, H.; Takakura, K.; Shigaki, K.; Kuboyama, S.; Matsuda, S.; Simoen, Eddy; Claeys, Cor (2003) -
Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs
Hayama, K.; Takakura, T.; Ohyama, H.; Kuboyama, S.; Matsuda, S.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005) -
Radiation source dependence on floating-body effect in thin gate oxide fully-depleted SOI N-MOSFETs
Hayama, K.; Ohyama, H.; Takakura, K.; Kuboyama, S.; Jono, T.; Oka, K.; Matsuda, S.; Simoen, Eddy; Claeys, Cor (2004) -
Radiaton damage of SiC Schotttky diodes by electron irradiation
Ohyama, H.; Takakura, K.; Watanabe, T.; Nishiyama, K.; Shigaki, K.; Kudou, T.; Nakabayashi, M.; Kuboyama, S.; Matsuda, S.; Kamezawa, C.; Simoen, Eddy; Claeys, Cor (2005)