Browsing by author "Watanabe, Kenji"
Now showing items 1-9 of 9
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2D-3D integration of hexagonal boron nitride and a high-kappa dielectric for ultrafast graphene-based electro-absorption modulators
Agarwal, Hitesh; Terres, Bernat; Orsini, Lorenzo; Montanaro, Alberto; Sorianello, Vito; Pantouvaki, Marianna; Watanabe, Kenji; Taniguchi, Takashi; Van Thourhout, Dries; Romagnoli, Marco; Koppens, Frank H. L. (2021) -
A practical application of multiple parameters profile characterization (MPPC) using CD-SEM on production wafers using Hyper-NA lithography
Ishimoto, Toru; Sekiguchi, Kohei; Hasegawa, Norio; Watanabe, Kenji; Laidler, David; Cheng, Shaunee (2009) -
Advanced CD-SEM metrology to improve total process control performance for hyper-NA lithography
Osaki, Mayuka; Tanaka, Maki; Shishido, Chie; Ishimoto, Toru; Hasegawa, Norio; Sekiguchi, Kohei; Watanabe, Kenji; Cheng, Shaunee; Laidler, David; Ercken, Monique; Altamirano Sanchez, Efrain (2008) -
Asymmetric photoelectric effect: Auger-assisted hot hole photocurrents in transition metal dichalcogenides
Sushko, Andrey; De Greve, Kristiaan; Phillips, Madeleine; Urbaszek, Bernhard; Joe, Andrew Y.; Watanabe, Kenji; Taniguchi, Takashi; Efros, Alexander L.; Hellberg, C. Stephen; Park, Hongkun; Kim, Philip; Lukin, Mikhail D. (2021) -
Electrically controlled emission from singlet and triplet exciton species in atomically thin light-emitting diodes
Joe, Andrew Y.; Jauregui, Luis A.; Pistunova, Kateryna; Valdivia, Andres M. Mier; Lu, Zhengguang; Wild, Dominik S.; Scuri, Giovanni; De Greve, Kristiaan; Gelly, Ryan J.; Zhou, You; Sung, Jiho; Sushko, Andrey; Taniguchi, Takashi; Watanabe, Kenji; Smirnov, Dmitry; Lukin, Mikhail D.; Park, Hongkun; Kim, Philip (2021) -
Excitons in a reconstructed moire potential in twisted WSe2/WSe2 homobilayers
Andersen, Trond, I; Scuri, Giovanni; Sushko, Andrey; De Greve, Kristiaan; Sung, Jiho; Zhou, You; Wild, Dominik S.; Gelly, Ryan J.; Heo, Hoseok; Berube, Damien; Joe, Andrew Y., III; Jauregui, Luis A.; Watanabe, Kenji; Taniguchi, Takashi; Kim, Philip; Park, Hongkun; Lukin, Mikhail D. (2021) -
MuGFET Observation and CD measurement by using CD-SEM
Maeda, Tatsuya; Tanaka, Maki; Isawa, Miki; Watanabe, Kenji; Hasegawa, Norio; Sekiguchi, Kohei; Rooyackers, Rita; Collaert, Nadine; Vandeweyer, Tom (2008-02) -
Use of the indirect photoluminescence peak as an optical probe of interface defectivity in MoS2
Leonhardt, Alessandra; Lockhart de la Rosa, Cesar Javier; Nuytten, Thomas; Banszerus, Luca; Sergeant, Stefanie; Koladi Mootheri, Vivek; Taniguchi, Takashi; Watanabe, Kenji; Stampfer, Christoph; Huyghebaert, Cedric; De Gendt, Stefan (2020) -
Validation of CD-SEM etching residue evaluation technique for MuGFET structures
Isawa, Miki; Tanaka, Maki; Maeda, Tatsuya; Watanabe, Kenji; Vandeweyer, Tom; Collaert, Nadine; Rooyackers, Rita (2009)