Browsing by author "Naka, N."
Now showing items 1-7 of 7
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Elastic relaxation evaluation in SiGe/Si hetero-epitaxial structures
Bargallo Gonzalez, Mireia; Naka, N.; Hikavyy, Andriy; Eneman, Geert; Loo, Roger; Simoen, Eddy; Claeys, Cor (2011) -
Elastic relaxation evaluation in SiGe/Si hetero-epitaxial structures
Bargallo Gonzalez, Mireia; Naka, N.; Hikavyy, Andriy; Eneman, Geert; Loo, Roger; Simoen, Eddy; Claeys, Cor (2011) -
Evaluation of electron irradiated embedded SiGe source/drain diodes by Raman spectroscopy
Ohyama, Hidenori; Naka, N.; Takakura, K.; Tsunoda, I.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Claeys, Cor (2011) -
Evaluation of electron irradiated embedded SiGe source/drain diodes by Raman spectroscopy
Oyhama, Hidenori; Naka, N.; Takakura, K.; Tsunoda, I.; Londos, C.A; Bargallo Gonzalez, Mireia; Simoen, Eddy; Claeys, Cor (2010) -
Evaluation of electron irradiated SiGe/Si diodes by Raman spectroscopy
Tsunoda, I.; Naka, N.; Takakura, K.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Claeys, Cor; Ohyama, Hidenori (2010) -
Strain evaluation of electron irradiated SiGe/Si diodes by Raman spectroscopy
Naka, N.; Ohyama, H.; Tsunoda, I.; Takakura, K.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Claeys, Cor (2010) -
Stress analysis of Si1-xGex embedded source/drain junctions
Bargallo Gonzalez, Mireia; Simoen, Eddy; Naka, N.; Okuno, Y; Eneman, Geert; Hikavyy, Andriy; Verheyen, Peter; Loo, Roger; Claeys, Cor; Machkaoutsan, Vladimir; Tomasini, Pierre; Thomas, S.G.; Lu, J.P; Wise, Rick (2008)