Browsing by author "De Heyn, Vincent"

3D sequential stacked planar devices featuring low-temperature replacement metal gate junctionless top devices with improved reliability

Vandooren, Anne; Franco, Jacopo; Parvais, Bertrand; Wu, Zhicheng; Witters, Liesbeth; Walke, Amey; Li, Waikin; Peng, Lan; Deshpande, Veeresh Vidyadhar; Bufler, Fabian; Rassoul, Nouredine; Hellings, Geert; Jamieson, Geraldine; Inoue, Fumihiro; Verbinnen, Greet; Devriendt, Katia; Teugels, Lieve; Heylen, Nancy; Vecchio, Emma; Tao, Zheng; Rosseel, Erik; Vanherle, Wendy; Hikavyy, Andriy; Chan, BT; Ritzenthaler, Romain; Besnard, Guillaume; Schwarzenbach, Walter; Gaudin, Gweltaz; Radu, Ionut; Nguyen, Bich-Yen; Waldron, Niamh; De Heyn, Vincent; Mocuta, Dan; Collaert, Nadine (2018-11)

3D sequential stacked planar devices on 300 mm wafers featuring replacement metal gate junction-less top devices processed at 525°C with improved reliability

Vandooren, Anne; Franco, Jacopo; Parvais, Bertrand; Wu, Zhicheng; Witters, Liesbeth; Walke, Amey; Li, Waikin; Peng, Lan; Deshpande, Veeresh Vidyadhar; Bufler, Fabian; Rassoul, Nouredine; Hellings, Geert; Jamieson, Geraldine; Inoue, Fumihiro; Verbinnen, Greet; Devriendt, Katia; Teugels, Lieve; Heylen, Nancy; Vecchio, Emma; Tao, Zheng; Rosseel, Erik; Vanherle, Wendy; Hikavyy, Andriy; Chan, BT; Ritzenthaler, Romain; Besnard, Guillaume; Schwarzenbach, Walter; Gaudin, Gweltaz; Radu, Ionut; Nguyen, Bich-Yen; Waldron, Niamh; De Heyn, Vincent; Mocuta, Dan; Collaert, Nadine (2018)

A 0.65-to-1.4 nJ/burst 3-to-10 GHz UWB all-digital TX in 90 nm CMOS for IEEE 802.15.4a

Ryckaert, Julien; Van der Plas, Geert; De Heyn, Vincent; Desset, Claude; Van Poucke, Bart; Craninckx, Jan (2007)

A 0.65-to-1.4nJ/burst 3-to-10GHz UWB digital transmitter in 90nm CMOS for IEEE 802.15.4a

Ryckaert, Julien; Van der Plas, Geert; De Heyn, Vincent; Desset, Claude; Vanwijnsberghe, Geert; Van Poucke, Bart; Craninckx, Jan (2007-02)

A CMOS ultra-wideband receiver for low data-rate communication

Ryckaert, Julien; Verhelst, M.; Badaroglu, Mustafa; D'Amico, S.; De Heyn, Vincent; Desset, Claude; Nuzzo, Pierluigi; Van Poucke, Bart; Wambacq, Piet; Baschirotto, A.; Dehaene, Wim; Van der Plas, Geert (2007)

A fast start-up 3GHz-10GHz digitally controlled oscillator for UWB impulse radio in 90nm CMOS

De Heyn, Vincent; Van der Plas, Geert; Ryckaert, Julien; Craninckx, Jan (2007-09)

A record GmSAT/SSSAT and PBTI reliability in Si-passivated Ge nFinFETs by improved gate stack surface preparation

Arimura, Hiroaki; Cott, Daire; Boccardi, Guillaume; Loo, Roger; Wostyn, Kurt; Brus, Stephan; Capogreco, Elena; Opdebeeck, Ann; Witters, Liesbeth; Conard, Thierry; Suhard, Samuel; van Dorp, Dennis; Kenis, Karine; Ragnarsson, Lars-Ake; Mitard, Jerome; Holsteyns, Frank; De Heyn, Vincent; Mocuta, Dan; Collaert, Nadine; Horiguchi, Naoto (2019-06)

Advanced planar bulk and multigate CMOS technology: analog circuit benchmarking up to mm-wave frequencies

Wambacq, Piet; Mercha, Abdelkarim; Scheir, Karen; Verbruggen, Bob; Borremans, Jonathan; De Heyn, Vincent; Thijs, Steven; Linten, Dimitri; Van der Plas, Geert; Parvais, Bertrand; Dehan, Morin; Decoutere, Stefaan; Soens, Charlotte; Collaert, Nadine; Jurczak, Gosia (2008)

Bidirectional NPN ESD protection in silicon photonics technology

Boschke, Roman; Chen, Shih-Hung; Hellings, Geert; Scholz, Mirko; De Heyn, Vincent; Verheyen, Peter; Van Campenhout, Joris; Linten, Dimitri; Thean, Aaron; Groeseneken, Guido (2016)

BTI reliability improvement strategies in low thermal budget gate dtacks for 3D sequential integration

Franco, Jacopo; Wu, Zhicheng; Rzepa, Gerhard; Vandooren, Anne; Arimura, Hiroaki; Ragnarsson, Lars-Ake; Hellings, Geert; Brus, Stephan; Cott, Daire; De Heyn, Vincent; Groeseneken, Guido; Horiguchi, Naoto; Ryckaert, Julien; Collaert, Nadine; Linten, Dimitri; Grasser, Tibor; Kaczer, Ben (2018-12)

Buried metal line compatible with 3D sequential integration for top tier planar devices dynamic Vth tuning and RF shielding applications

Vandooren, Anne; Wu, Zhicheng; Khaled, Ahmad; Franco, Jacopo; Parvais, Bertrand; Li, W.; Witters, Liesbeth; Walke, Amey; Peng, Lan; Rassoul, Nouredine; Matagne, Philippe; Jamieson, Geraldine; Inoue, Fumihiro; Nguyen, B.Y.; Debruyn, Haroen; Devriendt, Katia; Teugels, Lieve; Heylen, Nancy; Vecchio, Emma; Zheng, T.; Radisic, Dunja; Rosseel, Erik; Vanherle, Wendy; Hikavyy, Andriy; Chan, BT; Besnard, G.; Schwarzenbach, W.; Gaudin, G.; Radu, Iuliana; Waldron, Niamh; De Heyn, Vincent; Demuynck, Steven; Boemmels, Juergen; Ryckaert, Julien; Collaert, Nadine; Mocuta, Dan (2019)

Carrier-based UWB impulse radio: simplicity, flexibility, and pulser implementation in 180 nm CMOS

Ryckaert, Julien; Badaroglu, Mustafa; Desset, Claude; De Heyn, Vincent; Van der Plas, Geert; Wambacq, Piet; Van Poucke, Bart; Donnay, Stephane (2005-09)

Channel Length Dependence of PBTI in High-k First RMG Gate Stack Integration Scheme

Parihar, Narendra; Arutchelvan, Goutham; Franco, Jacopo; Baudot, Sylvain; Opdebeeck, Ann; Demuynck, Steven; Arimura, Hiroaki; Ragnarsson, Lars-Ake; Mitard, Jerome; De Heyn, Vincent; Mercha, Abdelkarim (2021)

Characterization and modeling of transient device behavior under CDM ESD stress

Willemen, J.; Andreini, A.; De Heyn, Vincent; Esmark, K.; Etherton, M.; Gieser, H.; Groeseneken, Guido; Mettler, S.; Morena, E.; Qu, S.; Soppa, W.; Stadler, W.; Stella, R.; Wilkening, W.; Wolf, H.; Zullino, L. (2003)

Characterization and modeling of transient device behavior under CMD ESD stress

Willemen, J.; Andreini, A.; De Heyn, Vincent; Esmark, K.; Etherton, M.; Gieser, H.; Groeseneken, Guido; Mettler, S.; Morena, E.; Qu, N.; Soppa, W.; Stadler, W.; Stella, R.; Wilkening, W.; Wolf, H.; Zullino, L. (2004)

CMOS area scaling and the need for high aspect ratio vias

Briggs, Basoene; Guissi, Sofiane; Wilson, Chris; Ryckaert, Julien; Paolillo, Sara; Vandersmissen, Kevin; Versluijs, Janko; Lorant, Christophe; Heylen, Nancy; Boemmels, Juergen; Tokei, Zsolt; Sherazi, Yasser; Weckx, Pieter; Kljucar, Luka; van der Veen, Marleen; Boccardi, Guillaume; De Heyn, Vincent; Gupta, Anshul; Ervin, Joseph; Kamon, Matt (2018)