Browsing by author "El-Kazzi, Mario"
Now showing items 1-7 of 7
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H2S molecular beam passivation of Ge(001)
Merckling, Clement; Chang, Yao-Chung; Lu, Chung-Yu; Penaud, Julien; El-Kazzi, Mario; Bellenger, Florence; Brammertz, Guy; Hong, Minghwei; Kwo, Raynien; Meuris, Marc; Dekoster, Johan; Heyns, Marc; Caymax, Matty (2011) -
High oxidation state at the epitaxial interface of g-Al2O3 thin films grown on Si(111) and Si(001)
El-Kazzi, Mario; Merckling, Clement; Saint-Girons, Guillaume; Grenet, Genevieve; Silly, M.; Sirotti, F.; Hollinger, Guy (2010) -
Molecular beam epitaxy passivation studies of Ge and III-V semiconductors for advanced CMOS
Merckling, Clement; Penaud, Julien; Kohen, David; Bellenger, Florence; Alian, AliReza; Brammertz, Guy; El-Kazzi, Mario; Houssa, Michel; Dekoster, Johan; Caymax, Matty; Meuris, Marc; Heyns, Marc (2009) -
Molecular Beam Epitaxy study of a common a-GeO2 interfacial passivation layer for Ge- and GaAs-based MOS heterostructures
Merckling, Clement; Penaud, Julien; Bellenger, Florence; Kohen, David; Brammertz, Guy; Alian, AliReza; Pourtois, Geoffrey; Scarrozza, Marco; Houssa, Michel; El-Kazzi, Mario; Dekoster, Johan; Caymax, Matty; Meuris, Marc; Heyns, Marc (2009) -
Strategies for CMOS low equivalent oxide thickness achievement with high-k oxides grown on Si(001) by MBE
Beccera, Loic; Baboux, Nicolas; Plossu, Carole; Merckling, Clement; El-Kazzi, Mario; Saint-Girons, Guillaume; Vilquin, Bertrand; Hollinger, Guy (2008) -
Synchrotron radiation and conventional X-ray source photoemission studies of epitaxial g-Al2O3 thin films grown on Si(111) & Si(001) substrates by molecular beam epitaxy
El-Kazzi, Mario; Merckling, Clement; Grenet, Genevieve; Saint-Girons, Guillaume; Sirotti, Fausto; Hollinger, Guy (2009) -
X-ray photoelectron diffraction study of thin Al2O3 films grown on Si(111) by molecular beam epitaxy
El-Kazzi, Mario; Grenet, Genevieve; Merckling, Clement; Saint-Girons, Guillaume; Botella, Claude; Marty, Olivier; Hollinger, Guy (2009)