Browsing by author "Tomaszewski, D."
Now showing items 1-5 of 5
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Extraction of accurate lifetime and doping profiles in Si p-n junction diodes
Simoen, Eddy; Claeys, Cor; Czerwinski, A.; Tomaszewski, D.; Gibki, J.; Bakowski, A.; Katcki, J. (1997) -
Improved extraction of Si substrate parameters from combined I-V and C-V measurements on P-N junction diodes
Czerwinski, A.; Simoen, Eddy; Vanhellemont, Jan; Tomaszewski, D.; Gibki, J.; Bakowski, A. (1997) -
Metoda dokladnego wyznaczania parametrow polprzewodnika w zastosowaniu do pomiarow czasu zycia nosnikow i koncentracji domieszek / A method of accurate semiconductor parameters determination used for carrier lifetime and dopant concentration measurements
Czerwinski, A.; Tomaszewski, D.; Gibki, J.; Bakowski, A.; Simoen, Eddy; Vanhellemont, Jan (1997) -
Optimised diode analysis of electrical silicon substrate properties
Czerwinski, A.; Tomaszewski, D.; Gibki, J.; Bakowski, A.; Klima, K.; Katcki, J.; Simoen, Eddy; Claeys, Cor (1997) -
Optimized diode analysis of electrical silicon substrate properties
Czerwinski, A.; Simoen, Eddy; Claeys, Cor; Klima, K.; Tomaszewski, D.; Gibki, J.; Katcki, J. (1998)