Browsing by author "Gieser, H."
Now showing items 1-12 of 12
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Analysis of HBM ESD testers and specifications using a fourth order lumped element model
Verhaege, Koen; Roussel, Philippe; Groeseneken, Guido; Maes, Herman; Gieser, H.; Russ, Christian; Egger, P.; Guggenmos, X.; Kuper, F. G. (1994) -
Characterization and modeling of transient device behavior under CDM ESD stress
Willemen, J.; Andreini, A.; De Heyn, Vincent; Esmark, K.; Etherton, M.; Gieser, H.; Groeseneken, Guido; Mettler, S.; Morena, E.; Qu, S.; Soppa, W.; Stadler, W.; Stella, R.; Wilkening, W.; Wolf, H.; Zullino, L. (2003) -
Characterization and modeling of transient device behavior under CMD ESD stress
Willemen, J.; Andreini, A.; De Heyn, Vincent; Esmark, K.; Etherton, M.; Gieser, H.; Groeseneken, Guido; Mettler, S.; Morena, E.; Qu, N.; Soppa, W.; Stadler, W.; Stella, R.; Wilkening, W.; Wolf, H.; Zullino, L. (2004) -
Electrothermal device simulation of a gg-nMOSt under HBM ESD conditions
Russ, Christian; Kreisbeck, J.; Gieser, H.; Guggenmos, X.; Kanert, W. (1995) -
ESD protection elements during HBM stress tests - further numerical and experimental results
Russ, Christian; Gieser, H.; Verhaege, Koen (1994) -
ESD Protection Elements during HBM Stress Tests - Further Numerical and Experimental Results
Russ, Christian; Gieser, H.; Verhaege, K. (1994) -
ESD protection elements during HBM stress tests - further numerical and experimental results
Russ, Christian; Gieser, H.; Verhaege, Koen (1995) -
Influence of tester, test method and device type on CDM ESD testing
Verhaege, Koen; Groeseneken, Guido; Maes, Herman; Egger, P.; Gieser, H. (1994) -
Influence of tester, test method and device type on CDM ESD testing
Verhaege, K.; Groeseneken, Guido; Maes, Herman; Egger, P.; Gieser, H. (1995) -
Investigation into socketed CDM (SDM) tester parasitics
Chaine, M.; Verhaege, K.; Avery, L.; Kelly, M.; Gieser, H.; Bock, Karlheinz; Henry, L. G.; Meuse, T.; Brodbeck, T.; Barth, J. (1999) -
Test circuits for fast and reliable assessment if CDM robustness of I/O stages
Stadler, W.; Esmark, K.; Reynders, K.; Zubeidat, M.; Graf, M.; Wilkening, W.; Willemen, J.; Qu, D.; Mettler, S.; Etherton, M.; Nuernbergk, D.; Wolf, H.; Gieser, H.; Soppa, W.; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Groeseneken, Guido; Morena, E.; Stella, I.; Andreini, A.; Litzenberger, M.; Pogany, D.; Gornik, E.; Foss, C.; Konrad, A.; Frank, M. (2005) -
Test circuits for fast and reliable assessment of CDM robustness of I/O stages
Stadler, Wolfgang; Esmark, K.; Reynders, K.; Zuhbeidat, M.; Graf, M.; Wilkening, W.; Willemen, J.; Qu, S.; Settler, S.; Etherton, M.; Nuernbergk, D.; Wolf, H.; Gieser, H.; Soppa, W.; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Groeseneken, Guido; Morena, E.; Stella, R.; Andreini, A.; Litzenberger, M.; Pogany, D.; Gornik, E.; Foss, C.; Konrad, A.; Frank, M. (2003)