Browsing by author "Kim, Y."
Now showing items 1-5 of 5
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A systematic study of trade-offs in engineering a locally strained pMOSFET
Nouri, Faran; Verheyen, Peter; Washington, Lori; Moroz, Victor; De Wolf, Ingrid; Kawaguchi, S.; Biesemans, Serge; Schreutelkamp, Rob; Kim, Y.; Shen, M.; Xu, X.; Rooyackers, Rita; Jurczak, Gosia; Eneman, Geert; De Meyer, Kristin; Smith, L.; Pramanik, D.; Forstner, H.; Thirupapuliyur, S.; Higashi, G. (2004) -
Charge trapping and electron mobility degradation in MOCVD hafnium silicate gate dielectric stack structures
Young, C.D.; Kerber, Andreas; Hou, T.H.; Cartier, Eduard; Brown, G.A.; Bersuker, G.; Kim, Y.; Lim, C.; Gutt, J.; Lysaght, P.; Bennett, J.; Lee, C.H.; Gopalan, S.; Gardner, M.; Zeitzoff, P.; Groeseneken, Guido; Murto, R.W.; Huff, H.R. (2004) -
Charge trapping and mobility degradation in MOCVD hafnium silicate gate dielectric stack structures
Young, C.D.; Kerber, Andreas; Hou, T.H.; Cartier, E.; Brown, G.A.; Bersuker, G.; Kim, Y.; Lim, C.; Gutt, J.; Lysaght, P.; Bennett, J.; Lee, C.H.; Gopalan, S.; Gardner, M.; Zeitzoff, P.; Groeseneken, Guido; Murto, R.W.; Huff, H.R. (2003) -
Layout impact on the performance of a locally strained PMOSFET
Eneman, Geert; Verheyen, Peter; Rooyackers, Rita; Nouri, Faran; Washington, Lori; Degraeve, Robin; Kaczer, Ben; Moroz, Victor; De Keersgieter, An; Schreutelkamp, Rob; Kawaguchi, M.; Kim, Y.; Samoilov, A.; Smith, L.; Absil, Philippe; De Meyer, Kristin; Jurczak, Gosia; Biesemans, Serge (2005) -
Study of Ni-Silicide contacts to Si:C source/drain
Cho, Moon Ju; Nouri, F.; Schreutelkamp, Rob; Kim, Y.; Mertens, Sofie; Verheyen, Peter; Steenbergen, Johnny; Vrancken, Christa; Richard, Olivier; Tokei, Zsolt; Lauwers, Anne; Bender, Hugo; Van Daele, Benny; Vandervorst, Wilfried; Geenen, Luc; Absil, Philippe; Kubicek, Stefan; Demeurisse, Caroline (2007)