Browsing by author "Cuduvally, Ramya"
Now showing items 1-17 of 17
-
3D imaging of atom probe tip shapes with atomic force microscopy
Fleischmann, Claudia; Paredis, Kristof; Melkonyan, Davit; Op de Beeck, Jonathan; Bogdanowicz, Janusz; Morris, Richard; Cuduvally, Ramya; Vandervorst, Wilfried (2018) -
A critical view on the accuracy of dopant profiling in atom probe tomography: The case of boron in silicon
Melkonyan, Davit; Fleischmann, Claudia; Bogdanowicz, Janusz; Morris, Richard; Cuduvally, Ramya; Vandervorst, Wilfried (2018) -
Accurate stoichiometric analysis of Al1 xGaxN/GaN structures using APT and the influence of laser, poles and zone lines
Morris, Richard; Arnoldi, Laurent; Cuduvally, Ramya; Melkonyan, Davit; Fleischmann, Claudia; Zhao, Ming; Vandervorst, Wilfried (2017) -
Analysis of III-nitride device heterostructures using APT
Morris, Richard; Cuduvally, Ramya; Zhao, Ming; van der Heide, Paul; Vandervorst, Wilfried (2018) -
Atom probe conditions for stoichiometric quantification of GaN and Al1 xGaxN
Morris, Richard; Arnoldi, Laurent; Cuduvally, Ramya; Melkonyan, Davit; Fleischmann, Claudia; Zhao, Ming; Vandervorst, Wilfried (2017) -
Atom probe of GaN/AlGaN heterostructures: the role of electric field, sample crystallography and laser excitation on quantification
Morris, Richard; Cuduvally, Ramya; Melkonyan, Davit; Zhao, Ming; van der Heide, Paul; Vandervorst, Wilfried (2019) -
Correcting the boron concentration for the detection losses through multi hit events.
Melkonyan, Davit; Fleischmann, Claudia; Bogdanowicz, Janusz; Morris, Richard; Cuduvally, Ramya; Vandervorst, Wilfried (2018) -
Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlN
Morris, Richard; Cuduvally, Ramya; Lin, Jhao-Rong; Zhao, Ming; Vandervorst, Wilfried; Thuvander, Mattias; Fleischmann, Claudia (2022-11) -
Influence of the tip field, laser, pole and zone lines on the quantification of GaN/AlGaN heterostructures
Morris, Richard; Cuduvally, Ramya; Melkonyan, Davit; Zhao, Ming; van der Heide, Paul; Vandervorst, Wilfried (2018) -
Opportunities and challenges in APT metrology for semiconductor applications
Fleischmann, Claudia; Cuduvally, Ramya; Morris, Richard; Melkonyan, Davit; Op de Beeck, Jonathan; Makhotkin, Igor; van der Heide, Paul; Vandervorst, Wilfried (2019) -
Post-field ionization of Si clusters in atom probe tomography: A joint theoretical and experimental study
Cuduvally, Ramya; Morris, Richard; Oosterbos, Giel; Ferrari, Piero; Fleischmann, Claudia; Forbes, Richard G.; Vandervorst, Wilfried (2022) -
Post-Ionization of Silicon Clusters in Atom Probe Microscopy: A Joint Theoretical and Experimental Investigation.
Cuduvally, Ramya; Oosterbos, Giel; Morris, Richard; Fleischmann, Claudia; Ferrari, Piero; Scheerder, Jeroen; Vantomme, Andre; Vandervorst, Wilfried (2019) -
Potential sources of compositional inaccuracy in the atom probe tomography of InxGa1-xAs
Cuduvally, Ramya; Morris, Richard; Ferrari, Piero; Bogdanowicz, Janusz; Fleischmann, Claudia; Melkonyan, Davit; Vandervorst, Wilfried (2020) -
Potential sources of inaccuracy for the composition quantification of InGaAs and InAlAs
Cuduvally, Ramya; Morris, Richard; Melkonyan, Davit; Arnoldi, Laurent; Bogdanowicz, Janusz; Fleischmann, Claudia; Vandervorst, Wilfried (2017) -
Quantitative compositional analysis of compound semiconductors by atom probe tomography
Cuduvally, Ramya; Morris, Richard; Bogdanowicz, Janusz; Melkonyan, Davit; Arnoldi, Laurent; Fleischmann, Claudia; Vandervorst, Wilfried (2018) -
Revealing the 3-dimensional shape of atom probe tips by atomic force microscopy
Fleischmann, Claudia; Paredis, Kristof; Melkonyan, Davit; Bogdanowicz, Janusz; Morris, Richard; Cuduvally, Ramya; Vandervorst, Wilfried (2017) -
Towards accurate composition analysis of GaN and AlGaN using Atom Probe Tomography
Morris, Richard; Cuduvally, Ramya; Melkonyan, Davit; Fleischmann, Claudia; Zhao, Ming; Arnoldi, Laurent; van der Heide, Paul; Vandervorst, Wilfried (2018)