Browsing by author "De Backer, E."
Now showing items 1-8 of 8
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Correlation between predicted cause of SRAM failures and in-line defect data
Coppens, P.; Vanhorebeek, Guido; De Backer, E. (2001) -
Impact of dummy metal structures on post oxide CMP planarization
Gillot, Christophe; De Backer, E.; Grillaert, Joost; Heylen, Nancy; Vaca, L. M.; Blavier, G. (1999) -
Impact of plasma density and pattern aspect ratio on plasma damage in deep submicron CMOS technologies
Creusen, Martin; Van den bosch, G.; van der Groen, Sonja; Groeseneken, Guido; Ackaert, J.; De Backer, E. (1999) -
Impact of reactor- and transistor-type on electron shading
Creusen, Martin; Ackaert, J.; De Backer, E.; Groeseneken, Guido (1999) -
Innovating SRAM design and test program for fast process related defect recognition and failure analysis
Coppens, P.; Vanhorebeek, Guido; De Backer, E.; Yuan, Xiao Jie (1999) -
Innovating SRAM design for fast process related defect recognition and failure analysis
Coppens, P.; Vanhorebeek, Guido; De Backer, E.; Yuan, Xiao Jie (1999) -
Plasma damage in HIMOSTM non-volatile memories (NVM)
Ackaert, J.; Lowe, A.; De Backer, E.; Boonen, S.; Yao, T.; Van Houdt, Jan; Haspeslagh, Luc (2004-05) -
Wafer-level packaged RF-MEMS switches fabricated in a CMOS fab
Tilmans, Harrie; Ziad, Hocine; Jansen, Henri; Di Monaco, Orsola; Jourdain, Anne; De Raedt, Walter; Rottenberg, Xavier; De Backer, E.; De Caussemaeker, Ann; Baert, Kris (2001)