Browsing by author "Selmi, L."
Now showing items 1-9 of 9
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Characterization of DC performance and low-frequency noise of an array of nMOS Forksheets from 300 K to 4 K
Asanovski, Ruben; Grill, Alexander; Franco, Jacopo; Palestri, P.; Mertens, Hans; Ritzenthaler, Romain; Horiguchi, Naoto; Kaczer, Ben; Selmi, L. (2024) -
Design of ultra-wideband low-noise amplifiers in 45nm CMOS technology: comparison between planar bulk and SOI FinFET devices
Ponton, Davide; Palestri, P.; Esseni, D.; Selmi, L.; Tiebout, M.; Parvais, Bertrand; Siprak, D.; Knoblinger, G. (2009) -
Design of UWB LNA in 45nm CMOS technology: Planar vs. FinFET
Ponton, Davide; Palestri, P; Esseni, D.; Selmi, L.; Tiebout, M.; Parvais, Bertrand; Knoblinger, G. (2008-05) -
Experimental and physics-based modeling assessment of strain induced mobility enhancement in FinFETs
Serra, N.; Conzatti, F.; Esseni, D.; De Michielis, M.; Palestri, P.; Selmi, L.; Thomas, S.; Whall, T. E.; Parker, E. H. C.; Leadley, D. R.; Witters, Liesbeth; Hikavyy, Andriy; Hytch, M. J.; Houdellier, F.; Snoeck, E.; Wang, T. J.; Lee, W. C.; Vellianitis, Georgios; Van Dal, Mark; Duriez, Blandine; Doornbos, Gerben; Lander, Rob (2009) -
Fabrication, characterization and modeling of strained SOI MOSFETs with very large effective mobility
Driussi, F.; Esseni, D.; Selmi, L.; Schmidt, M.; Lemme, M.; Kurz, H.; Buca, D.; Mantl, S.; Luysberg, M.; Loo, Roger; Nguyen, Duy; Reiche, M. (2007) -
Impact of band structure on charge trapping in thin SiO2/Al2O3/poly-Si gate stacks
Pantisano, Luigi; Lucci, L.; Cartier, Ed; Kerber, Andreas; Groeseneken, Guido; Green, M.; Selmi, L. (2004-05) -
Impact of high-mobility materials on the performance of near- and sub-threshold CMOS logic circuits
Crupi, F.; Albano, D.; Alioto, M.; Franco, Jacopo; Selmi, L.; Mitard, Jerome; Groeseneken, Guido (2013) -
New insights on the excess 1/f noise at cryogenic temperatures in 28 nm CMOS and Ge MOSFETs for quantum computing applications
Asanovski, R.; Grill, Alexander; Franco, Jacopo; Palestri, P.; Beckers, Arnout; Kaczer, Ben; Selmi, L. (2022) -
Polarity dependent charge trapping in thin SiO2/Al2O3 gate staks with poly-Si gate electrodes: influence of high temperature annealing
Lucci, Luca; Pantisano, Luigi; Cartier, Eduard; Kerber, Andreas; Groeseneken, Guido; Ho, M.Y.; Green, Martin; Selmi, L. (2002)