Browsing by author "Moens, Peter"
Now showing items 1-14 of 14
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A new substrate current free nLIGBT for junction isolated technologies
Bakeroot, Benoit; Doutreloigne, Jan; Moens, Peter (2004) -
An industry-ready 200 mm p-GaN E-mode GaN-on-Si power technology
Posthuma, Niels; You, Shuzhen; Stoffels, Steve; Wellekens, Dirk; Liang, Hu; Zhao, Ming; De Jaeger, Brice; Geens, Karen; Ronchi, Nicolo; Decoutere, Stefaan; Moens, Peter; Banerjee, Abhishek; Ziad, Hocine; Tack, Marnix (2018) -
Analysis and application of energy capability characterization methods in power MOSFETs
Van den Bosch, Geert; Moens, Peter; Gassot, Pierre; Wojchiechowski, Dominique; Groeseneken, Guido (2004) -
Characterization of dynamic SOA of power MOSFETs limited by electrothermal breakdown
Van den Bosch, Geert; Wojciechowski, Dominique; Elattari, Brahim; Moens, Peter; Groeseneken, Guido (2005-09) -
Charge trapping effects and interface state generation in a 40V lateral resurf pDMOS transistor
Moens, Peter; Van den Bosch, Geert; Wojciechowski, Dominique; Bauwens, Filip; De Vleeschouwer, Herbert; De Pestel, Freddy (2005-09) -
Comprehensive study of postprocessed copper heat sinks on smart power drivers for thermal SOA improvement
Van den Bosch, Geert; Driessens, Evelien; Webers, Tomas; Elattari, Brahim; Wojchiechowski, Dominique; Gassot, Pierre; Moens, Peter; Groeseneken, Guido (2005-04) -
Design and characterization of a post-processed copper heat sink for smart power drivers
Van den Bosch, Geert; Webers, Tomas; Driessens, Evelien; Elattari, Brahim; Wojciechowski, Dominique; Gassot, Pierre; Moens, Peter; Groeseneken, Guido (2005-04) -
Gate conduction mechanisms and lifetime modeling of p-gate AlGaN/GaN high-electron-mobility transistors
Stockman, Arno; Masin, Fabrizio; Meneghini, Matteo; Zanoni, Enrico; Meneghesso, Gaudenzio; Bakeroot, Benoit; Moens, Peter (2018) -
Hot carrier degradation phenomena in lateral and vertical DMOS transistors
Moens, Peter; Van den Bosch, Geert; Groeseneken, Guido (2004-04) -
Hot hole degradation effects in lateral nDMOS transistors
Moens, Peter; Van den Bosch, Geert; De Keukeleire, Catherine; Degraeve, Robin; Tack, Marnix; Groeseneken, Guido (2004-10) -
Reliability challenges in integrated high voltage devices
Moens, Peter; Van den Bosch, Geert (2005) -
Reliability sssessment of integrated power transistors: lateral DMOS versus vertical DMOS
Moens, Peter; Van den Bosch, Geert (2008) -
Temperature dependent substrate trapping in AlGaN/GaN power devices and the impact on dynamic ron
Stockman, Arno; Uren, Michael; Tajalli, Alaleh; Meneghini, Matteo; Bakeroot, Benoit; Moens, Peter (2017) -
Threshold voltage instability mechanisms in p-GaN gate AlGaN/GaN HEMTs
Stockman, Arno; Canato, Eleonora; Meneghini, Matteo; Meneghesso, Gaudenzio; Moens, Peter; Bakeroot, Benoit (2019)