Browsing by author "Pavan, Paolo"
Now showing items 1-4 of 4
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A comprehensive understanding of the erase of TANOS memories through charge separation experiments and simulations
Padovani, Andrea; Arreghini, Antonio; Vandelli, Luca; Larcher, Luca; Van den Bosch, Geert; Pavan, Paolo; Van Houdt, Jan (2011) -
Effects of border traps on transfer curve hysteresis and split-CV mobility measurement in InGaAs quantum-well MOSFETs
Pavan, Paolo; Puglisi, F. M.; Zagni, Nicolo; Alian, AliReza; Thean, Aaron; Collaert, Nadine; Verzellesi, G. (2016) -
Probing defects generation during stress in high- $j/metal gate FinFETs by random telegraph noise characterization
Puglisi, Francesco Maria; Costantini, Felipe; Kaczer, Ben; Larcher, Luca; Pavan, Paolo (2016) -
Role of holes and electrons during erase of TANOS memories: evidence for dipole formation and its impact on reliability
Vandelli, Luca; Arreghini, Antonio; Padovani, Andrea; Larcher, Luca; Van den Bosch, Geert; Della Marca, Vincenzo; Pavan, Paolo; Jurczak, Gosia; Van Houdt, Jan (2010)