Browsing by author "Kocaay, Deniz"
Now showing items 1-8 of 8
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Current understanding of BEOL TDDB lifetime models
Croes, Kristof; Wu, Chen; Kocaay, Deniz; Li, Yunlong; Roussel, Philippe; Boemmels, Juergen; Tokei, Zsolt (2015) -
Effect of line-overlay and via-misalignment on dielectric reliability for different patterning schemes
Croes, Kristof; Ciofi, Ivan; Kocaay, Deniz; Tokei, Zsolt; Boemmels, Juergen (2014) -
Impact of litho-patterning variations on the electrical performance and variability of advanced interconnects
Ciofi, Ivan; Roussel, Philippe; Baert, Rogier; Kocaay, Deniz; Contino, Antonino; Croes, Kristof; Saad, Yves; Gao, Weimin; Moroz, Victor; Wilson, Chris; Mocuta, Dan; Tokei, Zsolt (2018) -
Impact of process variability on BEOL TDDB lifetime model assessment
Croes, Kristof; Kocaay, Deniz; Ciofi, Ivan; Boemmels, Juergen; Tokei, Zsolt (2015) -
Interconnect metals beyond copper: reliability challenges and opportunities
Croes, Kristof; Adelmann, Christoph; Wilson, Chris; Zahedmanesh, Houman; Varela Pedreira, Olalla; Wu, Chen; Lesniewska, Alicja; Oprins, Herman; Beyne, Sofie; Ciofi, Ivan; Kocaay, Deniz; Stucchi, Michele; Tokei, Zsolt (2018) -
LER and spacing variability on BEOL TDDB using E-field mapping: Impact of field acceleration
Kocaay, Deniz; Roussel, Philippe; Croes, Kristof; Ciofi, Ivan; Saad, Yves; De Wolf, Ingrid (2017) -
Method to assess the impact of LER and spacing variation on BEOL dielectric reliability using 2D-field simulations for <20nm spacing
Kocaay, Deniz; Roussel, Philippe; Croes, Kristof; Ciofi, Ivan; Lesniewska, Alicja; De Wolf, Ingrid (2018) -
Reliability mechanisms and lifetime extrapolation methods for scaled interconnect technologies
Croes, Kristof; Wu, Chen; Kocaay, Deniz; Boemmels, Juergen; Tokei, Zsolt (2015)