Browsing by author "Bosman, Gijs"
Now showing items 1-10 of 10
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A low-frequency noise study of state-of-the-art silicon n+p junction diodes
Simoen, Eddy; Vanhellemont, Jan; Claeys, Cor; Bosman, Gijs (1995) -
Bulk defect induced low-frequency noise in n+-p silicon diodes
Hou, F. C.; Bosman, Gijs; Simoen, Eddy; Vanhellemont, Jan; Claeys, C. (1998) -
Extended defect related excess low-frequency noise in Si junction diodes
Simoen, Eddy; Vanhellemont, Jan; Bosman, Gijs; Czerwinsky, A.; Claeys, Cor (1996) -
Impact of the substrate on the low-frequency noise of silicon n+p junction diodes
Simoen, Eddy; Bosman, Gijs; Vanhellemont, Jan; Claeys, Cor (1995) -
Impact of the substrate quality on the low frequency noise of silicon diodes
Simoen, Eddy; Bosman, Gijs; Vanhellemont, Jan; Claeys, Cor (1994) -
Impact of the substrate quality on the low frequency noise of silicon diodes
Simoen, Eddy; Bosman, Gijs; Vanhellemont, Jan; Claeys, Cor (1996) -
Noise characterization of gated silicon p-n diodes
Hou, F. C.; Bosman, Gijs; Simoen, Eddy; Claeys, Cor (1997) -
On the electrical activity of oxygen-related extended defects in silicon
Vanhellemont, Jan; Simoen, Eddy; Bosman, Gijs; Claeys, Cor; Kaniava, Arvydas; Gaubas, Eugenijus; Blondeel, A.; Clauws, P. (1994) -
On the impact of low fluence irradiation with MeV particles on silicon diode characteristics and related material properties
Vanhellemont, Jan; Simoen, Eddy; Claeys, Cor; Kaniava, Arvydas; Gaubas, Eugenijus; Bosman, Gijs; Johlander, B.; Adams, L.; Clauws, P. (1994) -
The impact of the substrate on the electrical performance of silicon junction diodes
Simoen, Eddy; Vanhellemont, Jan; Bosman, Gijs; Claeys, Cor (1994)