Browsing by author "Rasras, Mahmoud"
Now showing items 1-20 of 25
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A reliability study of titanium silicide lines using micro-raman spectroscopy and electron microscopy
De Wolf, Ingrid; Howard, Dave; Rasras, Mahmoud; Lauwers, A.; Maex, Karen; Groeseneken, Guido; Maes, Herman (1997) -
A reliability study of titanium silicide lines using micro-Raman spectroscopy and electron microscopy
De Wolf, Ingrid; Howard, Dave; Rasras, Mahmoud; Lauwers, A.; Maex, Karen; Groeseneken, Guido; Maes, Herman (1997) -
A simple, cost effective and very sensitive alternative for photon emission spectroscopy
Rasras, Mahmoud; De Wolf, Ingrid; Groeseneken, Guido; Maes, Herman; Vanhaeverbeke, S.; De Pauw, P. (1997) -
Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study
Kaczer, Ben; Degraeve, Robin; Rasras, Mahmoud; De Keersgieter, An; Van de Mieroop, Koen; Groeseneken, Guido (2002) -
Analysis of Iddq failures through spectral photon emission microscopy
Rasras, Mahmoud; De Wolf, Ingrid; Bender, Hugo; Groeseneken, Guido; Maes, Herman; Verhaverbeke, Steven; De Pauw, P. (1998) -
Analysis of Iddq failures through spectral photon emission microscopy
Rasras, Mahmoud; De Wolf, Ingrid; Bender, Hugo; Groeseneken, Guido; Maes, Herman; Verhaverbeke, Steven; De Pauw, P. (1998) -
Compact and High-Performance Mode Evolution based Polarization Splitter-Rotator in Standard Active Silicon Platform
Mohammed, Zakriya; Safian, Reza; Paredes, Bruna; Zhuang, Leimeng; Rasras, Mahmoud (2022) -
Explanation of nMOSFET substrate current after hard gate oxide breakdown
Kaczer, Ben; Degraeve, Robin; De Keersgieter, An; Rasras, Mahmoud; Groeseneken, Guido (2001) -
From photon emission microscopy to Raman spectroscopy: failure analysis in microelectronics
De Wolf, Ingrid; Rasras, Mahmoud (2004) -
High resolution stress and temperature measurements in semiconductor devices using micro-Raman spectroscopy
De Wolf, Ingrid; Chen, Jian; Rasras, Mahmoud; van Spengen, Merlijn; Simons, Veerle (1999) -
Impact of MOSFET gate oxide breakdown on digital circuit operation and reliability
Kaczer, Ben; Degraeve, Robin; Rasras, Mahmoud; Van de Mieroop, Koen; Roussel, Philippe; Groeseneken, Guido (2002) -
Impact of MOSFET oxide breakdown on digital circuit operation and reliability
Kaczer, Ben; Degraeve, Robin; Groeseneken, Guido; Rasras, Mahmoud; Kubicek, Stefan; Vandamme, Ewout; Badenes, Gonçal (2000) -
Impact of oxide breakdown on FET and circuit operation and reliability
Kaczer, Ben; Degraeve, Robin; De Keersgieter, An; Van de Mieroop, Koen; Rasras, Mahmoud; Simons, Veerle; Roussel, Philippe; Groeseneken, Guido (2001) -
Modification and application of an emission microscope for continuous wavelength spectroscopy
Rasras, Mahmoud; De Wolf, Ingrid; Groeseneken, Guido; Maes, Herman (1997) -
Modification and application of an emission microscope for continuous wavelength spectroscopy
Rasras, Mahmoud; De Wolf, Ingrid; Groeseneken, Guido; Maes, Herman (1997) -
Non-uniform triggering of gg-n MOSt investigated by combined emission microscopy and transmission line pulsing
Russ, Christian; Bock, Karlheinz; Rasras, Mahmoud; De Wolf, Ingrid; Groeseneken, Guido; Maes, Herman (1998) -
Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing
Russ, Christian; Bock, Karlheinz; Rasras, Mahmoud; De Wolf, Ingrid; Groeseneken, Guido; Maes, Herman (1999) -
Origin of substrate hole current after gate oxide breakdown
Rasras, Mahmoud; De Wolf, Ingrid; Groeseneken, Guido; Degraeve, Robin; Maes, Herman (2002) -
Photo-carrier generation as the origin of Fowler-Nordheim-induced substrate hole current in thin oxides
Rasras, Mahmoud; De Wolf, Ingrid; Groeseneken, Guido; Kaczer, Ben; Degraeve, Robin; Maes, Herman (1999) -
Photo-carrier generation as the origin of Fowler-Nordheim-induced substrate hole current in thin oxides
Rasras, Mahmoud; De Wolf, Ingrid; Groeseneken, Guido; Kaczer, Ben; Degraeve, Robin; Maes, Herman (2001)