Browsing by author "Karp, James"
Now showing items 1-4 of 4
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Challenges for I/O towards the 3-nm node: Si/SiGe superlatttice I/O finFET in a horizontal nanowire technology and the increased ausceptibility of bulk finFET technology to single event latchup
Hellings, Geert; Mertens, Hans; Karp, James; Maillard, Pierre; Subirats, Alexandre; Simoen, Eddy; Schram, Tom; Ragnarsson, Lars-Ake; Simicic, Marko; Chen, Shih-Hung; Parvais, Bertrand; Boudier, D; Cretu, B; Machillot, J; Pena, V; Sun, S; Yoshida, N; Kim, N; Mocuta, Anda; Linten, Dimitri; Hart, Michael; Horiguchi, Naoto (2018) -
HBM and CDM ESD Performance of Advanced Silicon Photonic Components
Chen, Shih-Hung; Karp, James; Simicic, Marko; Tsiara, Artemisia; Tsaggaris, Dean; Croes, Kristof; Ban, Yoojin; Tan, Phoumra; De Heyn, Peter; Chang, Jonathan; Hart, Michael J.; Wu, Xin; Linten, Dimitri; Van Campenhout, Joris (2021-10-27) -
Single event latch-up: increased sensitivity from planar to FinFET
Karp, James; Hart, Michael J.; Maillard, Pierre; Hellings, Geert; Linten, Dimitri (2017) -
Single event latch-up: increased sensitivity from planar to FinFET
Karp, James; Hart, Michael J.; Maillard, Pierre; Hellings, Geert; Linten, Dimitri (2018)