Browsing by author "Nafria, Montse"
Now showing items 1-7 of 7
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Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC source/drain
Amat, Esteve; Rodriguez, Rosana; Bargallo Gonzalez, Mireia; Martin Martinez, Javier; Nafria, Montse; Aymerich, Xavier; Machkaoutsan, Vladimir; Bauer, M.; Verheyen, (2010) -
Channel hot-carriers degradation in MOSFETs: A conductive AFM study at the nanoscale
Bayerl, A.; Porti, Marc; Martin-Martinez, Javier; Lanza, M.; Rodriguez, Rosanna; Velayudhan, V.; Amat, Esteve; Nafria, Montse; Aymerich, X.; Gonzalez, Mireia B; Simoen, Eddy (2013) -
Gate voltage influence on the channel hot-carrier degradation of high-k-based devices
Amat, Esteve; Kauerauf, Thomas; Degraeve, Robin; Rodríguez, Rosana; Nafria, Montse; Aymerich, Xavier; Groeseneken, Guido (2011) -
Negative bias temperature instability in devices with millisecond annealed ultra-shallow junctions
Moras, Miquel; Martin-Martinez, Javier; Rodriguez, Rosanna; Nafria, Montse; Aymerich, Xavier; Simoen, Eddy (2013) -
New insights into the wide ID range Channel Hot-Carrier degradation in high-k based devices
Amat, Esteve; Rodríguez, Rosana; Nafria, Montse; Aymerich, Xavier; Kauerauf, Thomas; Degraeve, Robin; Groeseneken, Guido (2009) -
Processing dependences of CHC degradation on strained-Si pMOSFETs
Amat, Esteve; Martin Martinez, Javier; Bargallo Gonzalez, Mireia; Rodriguez, Rosana; Nafria, Montse; Simoen, Eddy; Verheyen, Peter; Aymerich, Xavier (2010) -
SPICE modelling of hot-carrier degradation in Si1–xGex S/D and HfSiON based pMOS transistors
Martin Martinez, Javier; Amat, Esteve; Bargallo Gonzalez, Mireia; Verheyen, Peter; Rodriguez, Rosana; Nafria, Montse; Aymerich, Xavier; Simoen, Eddy (2010)