Browsing by author "Tempel, Georg"
Now showing items 1-9 of 9
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Analysis of silicide / diffusion contact resistance making use of transmission line stuctures
Akheyar, Amal; Lauwers, Anne; Lindsay, Richard; de Potter de ten Broeck, Muriel; Tempel, Georg; Maex, Karen (2002) -
Analytical model for failure rate prediction due to anomalous charge loss of Flash memories
Degraeve, Robin; Schuler, Franz; Lorenzini, Martino; Wellekens, Dirk; Hendrickx, Paul; Van Houdt, Jan; Haspeslagh, Luc; Groeseneken, Guido; Tempel, Georg (2001) -
Analytical percolation model for predicting anomalous charge loss in flash memories
Degraeve, Robin; Schuler, Franz; Kaczer, Ben; Lorenzini, Martino; Wellekens, Dirk; Hendrickx, Paul; Van Duuren, Michiel; Dormans, G.J.M.; Van Houdt, Jan; Haspeslagh, Luc; Groeseneken, Guido; Tempel, Georg (2004) -
Co-silicide, Co(Ni)-silicide and Ni-silicide to source/drain contact resistance
Akheyar, Amal; Lauwers, Anne; Kittl, Jorge; de Potter de ten Broeck, Muriel; Chamirian, Oxana; Jonckheere, Rik; Leunissen, Peter; Van Dal, Mark; Lindsay, Richard; Tempel, Georg; Maex, Karen (2003) -
Development of sub-10-nm atomic layer deposition barriers for Cu/low-k interconnects
Beyer, Gerald; Satta, Alessandra; Schuhmacher, Jörg; Maex, Karen; Besling, Wim; Kilpela, Olli; Sprey, Hessel; Tempel, Georg (2002) -
Electrical activity of B and As segregated at the Si-SiO2 interface
Fruehauf, Jens; Lindsay, Richard; Bergmaier, Andreas; Vandervorst, Wilfried; Tempel, Georg; Maex, Karen; Dollinger, Günther; Koch, Frederick (2002) -
Failure rate prediction and accelerated detection of anomalous charge loss in flash memories by using an analytical transient physics-based charge loss model
Schuler, Franz; Tempel, Georg; Melzner, H.; Jacob, M.; Hendrickx, Paul; Wellekens, Dirk; Van Houdt, Jan (2002) -
Statistical model for SILC and pre-breakdown current jumps in ultra-thin oxide layers
Degraeve, Robin; Kaczer, Ben; Schuler, Franz; Lorenzini, Martino; Wellekens, Dirk; Hendrickx, Paul; Van Houdt, Jan; Haspeslagh, Luc; Tempel, Georg; Groeseneken, Guido (2001) -
Time dependent anomalous charge loss modeling in flash memories and an accelerated testing procedure
Schuler, Franz; Tempel, Georg; Melzner, H.; Hendrickx, Paul; Wellekens, Dirk; Lorenzini, Martino; Van Houdt, Jan (2001)