Browsing by author "Moens, P."
Now showing items 1-20 of 32
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A comprehensive model for hot carrier degradation in LDMOS transistors
Moens, P.; Mertens, Jan; Bauwens, F.; Joris, P.; De Ceuninck, Ward; Tack, M. (2007) -
A fast and flexible thermal simulation tool validated on smart power devices
Desoete, B.; Moens, P.; Driessens, Evelien; Elattari, Brahim; Van den Bosch, Geert; Gillon, R.; Groeseneken, Guido (2005-05) -
A new lateral-IGBT structure with a wider safe operating area
Bakeroot, Benoit; Doutreloigne, Jan; Vanmeerbeek, P.; Moens, P. (2007) -
A new LIGBT structure to suppress substrate currents in a junction isolated technology
Bakeroot, Benoit; Doutreloigne, Jan; Moens, P. (2005) -
A novel hot-hole injection degradation model for lateral nDMOS transistors
Moens, P.; Tack, Marnix; Degraeve, Robin; Groeseneken, Guido (2001) -
A novel model for boron diffusion in SiGe strained layers based on a kinetic driven Ge-B pairing mechanism
Villaneuva, D.; Moens, P.; Krishnasamy, Rajendran; Schoenmaker, Wim (2001) -
A physical-statistical approach to AlGaN/GaN HEMT reliability
Moens, P.; Stockman, Arno (2019) -
A unified hot carrier degradation model for integrated lateral and vertical nDMOS transistors
Moens, P.; Van den Bosch, Geert; Groeseneken, Guido; Bolognesi, D. (2003) -
An ultrafast and latch-up free lateral IGBT with hole diverter for junction-isolated technologies
Bakeroot, Benoit; Doutreloigne, Jan; Vanmeerbeek, P.; Moens, P. (2007-06) -
Analysis of a narrow-base laterel IGBT with double buried layer for junction-isolated smart-power technologies
Bakeroot, Benoit; Doutreloigne, Jan; Vanmeerbeek, P.; Moens, P. (2008) -
Breakdown and hot carrier injection in deep trench isolation structures
Elattari, Brahim; Coppens, P.; Van den Bosch, Geert; Moens, P.; Groeseneken, Guido (2005) -
Calibration during the TCAD development of a high voltage pDEMOS in a sub-μm CMOS technology
Vermandel, Miguel; Doutreloigne, Jan; Moens, P.; Tack, Marnix (2000) -
Competing hot carrier degradation mechanisms in lateral n-type DMOS transistors
Moens, P.; Van den Bosch, Geert; Groeseneken, Guido (2003) -
Cost effective implementation of a 90 V RESURF P-type drain extended MOS in a 0.35 μm based smart power technology
Bakeroot, Benoit; Vermandel, Miguel; Moens, P.; Doutreloigne, Jan; Bolognesi, D. (2002) -
Differential variable base charge pumping (Delta-CP) for SiO2/SiC interface characterization
Moens, P.; Constant, A.; Stockman, Arno; Franchi, J.; Allerstam, F. (2019) -
Dynamic-ron control via proton irradiation in AlGaN/GaN transistors
Tajalli, A.; Stockman, Arno; Meneghini, M.; Mouhoubi, S.; Banerjee, A.; Gerardin, S.; Bagatin, M.; Paccagnella, A.; Zanoni, E.; Tack, M.; Bakeroot, Benoit; Moens, P.; Meneghesso, G. (2018) -
Effect of the n+-sinker in self-triggered bipolar ESD protection structures
De Heyn, Vincent; Mahadeva Iyer, Natarajan; Groeseneken, Guido; Reynders, K.; Moens, P. (2002) -
ESD-failure of E-mode GaN HEMTs: role of device geometry and charge trapping
Canato, E; Meneghini, M.; Nardo, A.; Masin, F.; Barbato, F.; Barbato, M.; Stockman, Arno; Banerjee, A.; Moens, P.; Zanoni, E.; Meneghesso, G. (2019) -
Evidence for source-side injection hot carrier effects on lateral DMOS transistors
Aresu, S.; De Ceuninck, Ward; Van den Bosch, Geert; Groeseneken, Guido; Moens, P.; Manca, Jean; Wojciechowski, D.; Gassot, P. (2004) -
Evidence for source-side injection hot carrier effects on lateral DMOS transistors
Aresu, Stefano; De Ceuninck, Ward; Van den Bosch, Geert; Groeseneken, Guido; Moens, P.; Manca, Jean; Wojciechowski, D.; Gassot, P. (2004)