Browsing by author "El-Sayed, Al-Moatasem"
Now showing items 1-10 of 10
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Ab initio treatment of silicon-hydrogen bond rupture at Si/SiO2 interfaces
Jech, Markus; El-Sayed, Al-Moatasem; Tyaginov, Stanislav; Shluger, Alexander L; Grasser, Tibor (2019) -
Bi-modal variability of nFinFET characteristics during hot-carrier stress: a modeling approach
Makarov, Alexander; Kaczer, Ben; Vaisman Chasin, Adrian; Vandemaele, Michiel; Grill, Alexander; Hellings, Geert; El-Sayed, Al-Moatasem; Grasser, Tibor; Linten, Dimitri; Tyaginov, Stanislav (2019) -
Border trap based modeling of SiC transistor transfer characteristics
Tyaginov, Stanislav; Jech, Markus; Rzepa, Gerhard; Grill, Alexander; El-Sayed, Al-Moatasem; Pobegen, Gregor; Makarov, Alexander; Grasser, Tibor (2018) -
Enhancing the quality of low temperature SiO2 by atomic hydrogen exposure for excellent NBTI reliability
Franco, Jacopo; de Marneffe, Jean-Francois; Vandooren, Anne; Kimura, Yosuke; Nyns, Laura; Wu, Zhicheng; El-Sayed, Al-Moatasem; Jech, Markus; Waldhoer, Dominic; Claes, Dieter; Arimura, Hiroaki; Ragnarsson, Lars-Ake; Afanas'ev, Valeri; Stesmans, Andre; Horiguchi, Naoto; Linten, Dimitri; Grasser, Tibor; Kaczer, Ben (2020) -
Quantum Chemistry Treatment of Silicon-Hydrogen Bond Rupture by Nonequilibrium Carriers in Semiconductor Devices
Jech, Markus; El-Sayed, Al-Moatasem; Tyaginov, Stanislav; Waldhoer, Dominic; Bouakline, Foudhil; Saalfrank, Peter; Jabs, Dominic; Jungemann, Christoph; Waltl, Michael; Grasser, Tibor (2021-01) -
Single-Versus Multi-Step Trap Assisted Tunneling Currents-Part II: The Role of Polarons
Schleich, Christian; Waldhoer, Dominic; El-Sayed, Al-Moatasem; Tselios, Konstantinos; Kaczer, Ben; Grasser, Tibor; Waltl, Michael (2022) -
Stochastic modeling of hot-carrier degradation in nFinFETs considering the impact of random traps and random dopants
Makarov, Alexander; Kaczer, Ben; Roussel, Philippe; Vaisman Chasin, Adrian; Vandemaele, Michiel; Hellings, Geert; El-Sayed, Al-Moatasem; Jech, Markus; Grasser, Tibor; Linten, Dimitri; Tyaginov, Stanislav (2019) -
Stochastic modeling of the impact of random dopants on hot-carrier degradation in n-FinFETs
Makarov, Alexander; Kaczer, Ben; Roussel, Philippe; Vaisman Chasin, Adrian; Grill, Alexander; Vandemaele, Michiel; Hellings, Geert; El-Sayed, Al-Moatasem; Grasser, Tibor; Linten, Dimitri; Tyaginov, Stanislav (2019) -
Structure, electronic properties, and energetics of oxygen vacancies in varying concentrations of SixGe1-xO2
El-Sayed, Al-Moatasem; Jech, Markus; Waldhoer, Dominic; Makarov, Alexander; Vexler, Mikhail, I; Tyaginov, Stanislav (2022) -
Understanding and physical modeling superior hot-carrier reliability of Ge pNWFETs
Tyaginov, Stanislav; El-Sayed, Al-Moatasem; Makarov, Alexander; Vaisman Chasin, Adrian; Arimura, Hiroaki; Vandemaele, Michiel; Jech, Markus; Capogreco, Elena; Witters, Liesbeth; Grill, Alexander; De Keersgieter, An; Eneman, Geert; Linten, Dimitri; Kaczer, Ben (2019)