Browsing by author "Raineri, Vito"
Now showing items 1-7 of 7
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Carrier Distribution in Silicon Devices by Atomic Force Microscopy on Etched Surfaces
Raineri, Vito; Privitera, Vittorio; Vandervorst, Wilfried; Hellemans, L.; Snauwaerts, Jan (1994) -
Carrier Profile Determination in Device Structures using AFM-Based Methods
Vandervorst, Wilfried; De Wolf, Peter; Clarysse, Trudo; Trenkler, Thomas; Hellemans, L.; Snauwaerts, Jan; Raineri, Vito (1995) -
On the Determination of Two-Dimensional Carrier Distributions
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Privitera, Vittorio; Raineri, Vito; Hellemans, L.; Snauwaerts, Jan (1994) -
On the determination of two-dimensional carrier distributions
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Hellemans, L.; Snauwaert, J.; Privitera, Vittorio; Raineri, Vito (1995) -
On the determination of two-dimensional carrier distributions
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Hellemans, L.; Snauwaert, J.; Privitera, Vittorio; Raineri, Vito (1995) -
Titanium silicidation and secondary defect annihilation in ion beam processed SiGe layers
Kyllesbech Larsen, K.; La Via, F.; Lombardo, S.; Raineri, Vito; Alves Donaton, Ricardo; Campisano, S. U. (1996) -
Two-dimensional spreading resistance profiling: recent understandings and applications
Vandervorst, Wilfried; Privitera, Vittorio; Raineri, Vito; Clarysse, Trudo; Pawlik, M. (1994)