Browsing by author "Rodriguez, Rosana"
Now showing items 1-12 of 12
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An equivalent circuit model for the recovery component of BTI
Martin-Martinez, Javier; Rodriguez, Rosana; Nafria, Montserat; Aymerich, X.; Kaczer, Ben; Groeseneken, Guido (2008-09) -
Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability
Martin-Martinez, Javier; Diaz Fortuny, Javier; Saraza Canflanca, Pablo; Rodriguez, Rosana; Castro-Lopez, Rafael; Roca, Elisenda; Fernandez, Francisco V.; Nafria, Montserrat (2023) -
Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC source/drain
Amat, Esteve; Rodriguez, Rosana; Bargallo Gonzalez, Mireia; Martin Martinez, Javier; Nafria, Montse; Aymerich, Xavier; Machkaoutsan, Vladimir; Bauer, M.; Verheyen, (2010) -
Channel-hot-carrier degradation of strained MOSFETs: a device level and nanoscale combined approach
Wu, Qian; Porti, Marc; Bayerl, Albin; Martin-Martinez, Javier; Rodriguez, Rosana; Nafria, Montserrat; Aymerich, Xavier; Simoen, Eddy (2015) -
Circuit design-oriented stochastic piecewise modeling of the postbreakdown gate current in MOSFETs: application to ring oscilators
Martin-Martinez, Javier; Kaczer, Ben; Degraeve, Robin; Roussel, Philippe; Rodriguez, Rosana; Nafria, Monserrat; Aymerich, X.; Dierickx, Bart; Groeseneken, Guido (2012) -
Circuit-design oriented modelling of the recovery BTI component and post-BD gate currents
Martin-Martinez, Javier; Kaczer, Ben; Boix, J.; Ayala, N.; Rodriguez, Rosana; Nafria, Montserrat; Aymerich, X.; Zuber, Paul; Dierickx, Bart; Groeseneken, Guido (2009-02) -
Experimental characterization of NBTI effect on pMOSFET and CMOS inverter
Fernandez, Raul; Kaczer, Ben; Gago, J.; Rodriguez, Rosana; Nafria, Montserrat (2009-02) -
Probabilistic defect occupancy model for NBTI
Martin-Martinez, Javier; Kaczer, Ben; Toledano Luque, Maria; Rodriguez, Rosana; Nafria, Monserat; Aymerich, X.; Groeseneken, Guido (2011-04) -
Processing dependences of CHC degradation on strained-Si pMOSFETs
Amat, Esteve; Martin Martinez, Javier; Bargallo Gonzalez, Mireia; Rodriguez, Rosana; Nafria, Montse; Simoen, Eddy; Verheyen, Peter; Aymerich, Xavier (2010) -
SPICE modelling of hot-carrier degradation in Si1–xGex S/D and HfSiON based pMOS transistors
Martin Martinez, Javier; Amat, Esteve; Bargallo Gonzalez, Mireia; Verheyen, Peter; Rodriguez, Rosana; Nafria, Montse; Aymerich, Xavier; Simoen, Eddy (2010) -
Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions
Saraza-Canflanca, Pablo; Rodriguez, Rosana; Martin-Martinez, Javier; Castro-Lopez, Rafael; Roca, Elisenda; V. Fernandez, Fancisco; Nafria, Montserrat; Diaz Fortuny, Javier (2021) -
Stochastic piecewise modeling of post-BD gate current oriented to circuit design
Martin-Martinez, Javier; Kaczer, Ben; Ayala, N; Rodriguez, Rosana; Nafria, Montserrat; Aymerich, X; Zuber, Paul; Dierickx, Bart (2008)