Browsing by author "Carin, Regis"
Now showing items 1-15 of 15
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A Low frequency noise characterization in n-channel UTBOX devices with 6 nm Si film
Cretu, Bogdan; Simoen, Eddy; Routoure, Jean-Marc; Carin, Regis; Aoulaiche, Marc; Claeys, Cor (2013) -
DC and low frequency noise performances of SOI p-FinFETs at very low temperature
Achour, Hakim; Talmat, Rachida; Cretu, Bogdan; Routoure, Jean-Marc; Benfdila, A.; Carin, Regis; Collaert, Nadine; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2013) -
Generation-recombination noise in advanced CMOS devices
Simoen, Eddy; Oliveira, Alberto; Boudier, Dimitri; Mitard, Jerome; Witters, Liesbeth; Veloso, Anabela; Agopian, Paula; Martino, Joao; Carin, Regis; Langer, Robert; Collaert, Nadine; Thean, Aaron; Claeys, Cor (2016) -
In-depth static and low-frequency noise characterization of n-channel FinFETs on SOI substrates at cryogenic temperature
Achour, H.; Cretu, Bogdan; Routoure, Jean-Marc; Carin, Regis; Talmat, Rachida; Benfdila, A.; Simoen, Eddy; Claeys, Cor (2014) -
Lessons learned from low-frequency noise studies on fully depleted UTBOX silicon-on-insulator MOSFETs
Simoen, Eddy; Aoulaiche, Marc; Santos, Sara Deresste D.; Martino, Joao; Strobel, Vincent; Cretu, Bogdan; Routoure, Jean-Marc; Carin, Regis; Luque Rodriguez, Abraham; Jimenez Tejada, Juan Antonio; Claeys, Cor (2013) -
Low frequency noise assessment in n- and p-channel sub-10 nm triple-gate FinFETs. Part I: Theory and methodology
Boudier, Dimitri; Cretu, Bogdan; Simoen, Eddy; Carin, Regis; Veloso, Anabela; Collaert, Nadine; Thean, Aaron (2017) -
Low frequency nosie spectroscopy in rotated UTBOX nMOSFETs
Cretu, Bogdan; Simoen, Eddy; Routoure, Jean-Marc; Carin, Regis; Aoulaiche, Marc; Claeys, Cor (2015) -
Low temperature noise spectroscopy of p-channel SOI FinFETs
Achour, Hakim; Cretu, Bogdan; Simoen, Eddy; Routoure, Jean-Marc; Carin, Regis; Talmat, Rachida; Benfdila, A.; Aoulaiche, Marc; Claeys, Cor (2014) -
Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics
Dos Santos, Sara; Cretu, Bogdan; Strobel, Vincent; Routoure, Jean-Marc; Carin, Regis; Martino, Joao Antonio; Aoulaiche, Marc; Simoen, Eddy; Claeys, Cor (2014) -
Low-frequency noise in high-k and SiO2 UTBOX SOI nMOSFETs
Dos Santos, Sara; Martino, Joao A.; Strobel, Vincent; Cretu, Bogdan; Routoure, Jean-Marc; Carin, Regis; Simoen, Eddy; Aoulaiche, Marc; Jurczak, Gosia; Claeys, Cor (2013) -
Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices
Simoen, Eddy; Cretu, Bogdan; Fang, Wen; Aoulaiche, Marc; Routoure, Jean-Marc; Carin, Regis; Luo, Jun; Zhao, Chao; Claeys, Cor (2016) -
Low-frequency noise studies on fully depleted UTBOX silicon-on-insulator nMOSFETs: challenges and opportunities
Simoen, Eddy; Aoulaiche, Marc; dos Santos, Sara; Martino, Joao; Strobel, Vincent; Cretu, Bogdan; Routoure, J.M.; Carin, Regis; Luque Rodriguez, Abraham; Jimenez Tejada, Juan Antonio; Claeys, Cor (2013) -
Performances under saturation operation of p-channel FinFETs on SOI substrates at cryogenic temperature
Achour, H.; Cretu, Bogdan; Routoure, Jean-Marc; Carin, Regis; Benfdila, A.; Simoen, Eddy; Claeys, Cor (2014) -
Towards single-trap spectroscopy: Generation-recombination noise in UTBOX SOI nMOSFETs
Simoen, Eddy; Cretu, Bogdan; Fang, Wen; Aoulaiche, Marc; Routoure, Jean-Marc; Carin, Regis; Dos Santos, Sara; Luo, Jun; Zhao, Chao; Martino, Joao; Claeys, Cor (2014) -
Towards single-trap spectroscopy: generation-recombination noise in UTBOX SOI nMOSFETs
Simoen, Eddy; Cretu, Bogdan; Fang, Wen; Aoulaiche, Marc; Routoure, Jean-Marc; Carin, Regis; dos Santos, Sara; Luo, Jun; Zhao, Chao; Martino, Joao Martino; Claeys, Cor (2015)