Browsing by author "Cardon, F."
Now showing items 21-28 of 28
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Nondestructive characterization of thin silicides using x-ray reflectivity
Detavernier, C.; De Gryse, R.; Van Meirhaeghe, R. L.; Cardon, F.; Ru, Guo-Ping; Qu, Xin-Ping; Li, Bing-Zong; Alves Donaton, Ricardo; Maex, Karen (2000) -
Orientation dependent stress build-up during the formation of epitaxial CoSi2
Steegen, An; Detavernier, C.; Maex, Karen; Van Meirhaeghe, R. L.; Cardon, F. (2000) -
Orientation-dependent stress build-up during the formation of epitaxial CoSi2
Steegen, An; Detavernier, C.; Lauwers, A.; Maex, Karen; Van Meirhaeghe, R. L.; Cardon, F. (2001) -
Silicide engineering: influence of alloying elements on CoSi2 nucleation
Detavernier, C.; Van Meirhaeghe, R. L.; Maex, Karen; Cardon, F. (2001) -
Silicide engineering: influence of alloying elements on CoSi2 nucleation
Detavernier, C.; Van Meirhaeghe, R. L.; Maex, Karen; Cardon, F. (2000) -
The influence of Ti capping layers on CoSi2 formation
Detavernier, C.; Donaton, R.; Maex, Karen; Van Meirhaeghe, R.; Cardon, F. (1999) -
The influence of Ti capping layers on CoSi2 formation
Detavernier, C.; Van Meirhaeghe, R. L.; Cardon, F.; Donaton, R. A.; Maex, Karen (2000) -
The influence of Ti capping layers on CoSi2 formation in the presence of interfacial oxide
Detavernier, C.; Alves Donaton, Ricardo; Maex, Karen; Jin, S.; Bender, Hugo; Van Meirhaeghe, R.; Cardon, F. (1999)