Browsing by author "Claeys, Cor"
Now showing items 21-40 of 1170
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A novel simple method to extract the effective LDD doping concentration on fully depleted SOI nMOSFET
Nicolett, A. S.; Martino, Joao Antonio; Simoen, Eddy; Claeys, Cor (1999) -
A semi-quantitative method for studying photoresist stripping
Rotondaro, Antonio; Meuris, Marc; Schmidt, Harald; Heyns, Marc; Vandervorst, Wilfried; Claeys, Cor; Hellemans, L.; Snauwert, L. (1994) -
A statistical approach to microdose induced degradation in FinFET devices
Griffoni, Alessio; Gerardin, S.; Roussel, Philippe; Degraeve, Robin; Meneghesso, G.; Paccagnella, A.; Simoen, Eddy; Claeys, Cor (2009) -
A study on radiation damage of IGBTs 2-MeV electrons at different temperatures
Nakabayashi, M.; Ohyama, H.; Hanano, N.; Kamiya, T.; Hirao, T.; Simoen, Eddy; Claeys, Cor (2004) -
A study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperatures
Ohyama, H.; Claeys, Cor; Nakabayashi, H.; Masakazu, T.; Simoen, Eddy; Hanano, M.; Naotika, F.; Hirao, T. (2003) -
A study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperatures
Nakabayashi, M.; Ohyama, H.; Hanano, N.; Kamiya, T.; Hirao, T.; Takakura, K.; Simoen, Eddy; Claeys, Cor (2004) -
A study on the self-heating effect in deep submicrometer partially depleted SOI MOSFET at low temperature
Pavanello, M.A.; Martino, J.A.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor; De Meyer, Kristin (2003) -
A two-dimensional model for interface coupling in triple-gate transistors
Akarvardar, Kerem; Mercha, Abdelkarim; Cristoloveanu, Sorin; Gentil, Pierre; Simoen, Eddy; Subramanian, Vaidy; Claeys, Cor (2007) -
A unified approach for hot-carrier degradation of DC current gain and 1/f noise of bipolar transistors
Decoutere, Stefaan; Simoen, Eddy; Vancuyck, Geert; Deferm, Ludo; Claeys, Cor (1997) -
Accurate extraction of the diffusion line current in silicon p-n junction diodes
Simoen, Eddy; Claeys, Cor; Czerwinski, A.; Katcki, J. (1998) -
Activation energy analysis as a tool for extraction and investigation of p-n junction leakage current components
Czerwinski, A.; Simoen, Eddy; Poyai, Amporn; Claeys, Cor (2003) -
Advanced semiconductor devices for future CMOS technologies
Claeys, Cor; Chiappe, Daniele; Collaert, Nadine; Mitard, Jerome; Radu, Iuliana; Rooyackers, Rita; Simoen, Eddy; Vandooren, Anne; Veloso, Anabela; Waldron, Niamh; Witters, Liesbeth; Thean, Aaron (2015) -
Advantages of different source/drain engineering on scaled UTBOX FD SOI nMOSFETs at high temperature operation
Nicoletti, Talitha; Dos Santos, Sara; Martino, Joao A.; Aoulaiche, Marc; Veloso, Anabela; Jurczak, Gosia; Simoen, Eddy; Claeys, Cor (2014) -
An active machine vision system for surface quality inspection
Claeys, Cor; Debusschere, Ingrid; Ricquier, Nico; Seitz, P.; Stalder, M.; Raynor, J.; Lang, G.; Cilia, G.; Cavana, C.; Müssigmann, U.; Abele, A. (1994) -
An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices
Trevisoli, R.D.; Martino, J.A.; Simoen, Eddy; Claeys, Cor; Pavanello, M.A. (2012) -
An analytical model for the non-linearity of triple gate SOI MOSFETs
Doria, R.T.; Martino, J.A.; Simoen, Eddy; Claeys, Cor; Pavanello, M.A. (2011) -
Analog application of SOI nFinFETs with different TiN gate electrode thickness operating at cryogenic temperatures
Rodrigues, M.; Galeti, M.; Collaert, Nadine; Simoen, Eddy; Claeys, Cor; Martino, J.A. (2010) -
Analog design with Line-TFET device experimental data: from device to circuit level
Filho, Walter G.; Simoen, Eddy; Rooyackers, Rita; Claeys, Cor; Collaert, Nadine; Martino, Joao; Agopian, Paula GD (2020) -
Analog operation of uniaxially and biaxially strained FD SOI nMOSFETs at cryogenic temperatures
de Souza, M.; Martino, J.A.; Simoen, Eddy; Claeys, Cor; Pavanello, M.A. (2008) -
Analog operation of uniaxially strained FD SOI nMOSFETs in cryogenic temperatures
de Souza, M.; Pavanello, M.A.; Martino, J.A.; Simoen, Eddy; Claeys, Cor (2007)