Browsing by author "Ohyama, Hidenori"
Now showing items 21-40 of 122
-
Effect of irradiation in InGaAs photo devices
Kudou, T.; Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Vanhellemont, Jan; Sigaki, K.; Takami, Y.; Fujii, A. (1999) -
Effect of irradiation on AlGaAs/GaAs p-HEMTs
Ohyama, Hidenori; Simoen, Eddy; Kuroda, S.; Claeys, C.; Takami, Y.; Tagiri, T.; Hakata, T. (1999) -
Effect of radiation source on the degradation in irradiated Si1-xGex epitaxial devices
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Sunaga, H.; Poortmans, Jef; Caymax, Matty (1996) -
Effects of electron irradiation on SiGe devices
Ohyama, Hidenori; Nagano, T.; Takakura, K.; Motoki, M.; Matsuo, K.; Nakamura, H.; Sawada, M.; Kuboyama, S.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Eneman, Geert; Claeys, Cor (2010) -
Effects of high-temperature gamma ray irradiation on npn Si transistors
Ohyama, Hidenori; Hirao, T.; Simoen, Eddy; Claeys, C.; Fukushima, Y.; Tanigawa, A.; Onoda, S. (2001) -
Effects of irradiation in InGaAs photo devices
Kudou, T.; Ohyama, Hidenori; Sigaki, K.; Simoen, Eddy; Vanhellemont, Jan; Claeys, C.; Takami, Y.; Fujii, A. (1997) -
Effects of mechanical stress on polycrystalline-silicon resistors
Nakabayashi, M.; Ohyama, Hidenori; Simoen, Eddy; Ikegami, M.; Claeys, Cor; Kobayashi, K.; Yoneoka, M.; Miyahara, K. (2002) -
Electron irradiation effects on thermal donors in Cz-Si
Takakura, K.; Ohyama, Hidenori; Murakawa, H.; Yoshida, T.; Rafi, Joan Marc; Job, R.; Ulyashin, A.; Simoen, Eddy; Claeys, Cor (2003) -
Electron irradiation induced defects in germanium-doped Czochralski silicon substrates and diodes
Chen, Jiahe; Vanhellemont, Jan; Simoen, Eddy; Lauwaert, Johan; Vrielinck, Henk; Rafi, Joan Marc; Ohyama, Hidenori; Weber, Jorg; Yang, Deren (2011) -
Electron-irradiation effects of CMOS integrated circuits with leakage current compensation
Hayama, Kiyoteru; Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Takizawa, H. (2000) -
Evaluation of electron irradiated embedded SiGe source/drain diodes by Raman spectroscopy
Ohyama, Hidenori; Naka, N.; Takakura, K.; Tsunoda, I.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Claeys, Cor (2011) -
Evaluation of electron irradiated SiGe/Si diodes by Raman spectroscopy
Tsunoda, I.; Naka, N.; Takakura, K.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Claeys, Cor; Ohyama, Hidenori (2010) -
Factors determining the damage coefficient and the low-frequency noise in MeV proton-irradiated silicon diodes
Simoen, Eddy; Claeys, Cor; Ohyama, Hidenori (1998) -
Factors determining the damage coefficients and the low-frequency noise in MeV proton irradiated silicon diodes
Simoen, Eddy; Claeys, C.; Ohyama, Hidenori; Takami, Y.; Sunaga, H. (1997) -
Factors determining the lifetime damage coefficients and the low-frequency noise in MeV proton irradiated silicon diodes
Simoen, Eddy; Claeys, Cor; Ohyama, Hidenori; Takami, Y.; Sunaga, H. (1999) -
Gate-length dependent radiation damage in 2-MeV electron-irradiated Si1-xGexS/D p-MOSFETs
Nakashima, Toshiyuki; Idemoto, Tatsuya; Tsunoda, Isao; Takakura, Kenichiro; Yoneoka, Masashi; Ohyama, Hidenori; Yoshino, Kenji; Simoen, Eddy; Claeys, Cor (2012) -
Germanium Content Dependence of Radiation Damage in Electron-Irradiated Strained Si1-xGex Epitaxial Devices
Ohyama, Hidenori; Vanhellemont, Jan; Sunaga, H.; Poortmans, Jef; Caymax, Matty; Clauws, P. (1994) -
High energy particle irradiation effects on the low-frequency noise of Czochralski silicon junction diodes
Simoen, Eddy; Vanhellemont, Jan; Dubuc, Jean-Paul; Claeys, Cor; Ohyama, Hidenori; Johlander, B. (1996) -
High energy proton irradiation effects on the electrical performance of silicon
Simoen, Eddy; Vanhellemont, Jan; Alaerts, André; Claeys, Cor; Ohyama, Hidenori; Sunaga, H.; Nahsiyama, I. (1996) -
High-energy boron-implantation and proton-irradiation effects in diodes with shallow trench isolation
Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Hayama, Kiyoteru; Kobayashi, K.; Ohyama, Hidenori; Takizawa, H.; Kokkoris, M.; Kossionides, E.; Fanourakis, G.; Mohammadzadeh, A. (2000)