Browsing by author "Jansen, Philippe"
Now showing items 21-39 of 39
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Lithography options for the 32nm half pitch node and beyond
Ronse, Kurt; Jansen, Philippe; Gronheid, Roel; Hendrickx, Eric; Maenhoudt, Mireille; Wiaux, Vincent; Goethals, Mieke; Jonckheere, Rik; Vandenberghe, Geert (2009) -
Modeling the subthreshold swing in MOSFET's
Vandamme, Ewout; Jansen, Philippe; Deferm, Ludo (1997) -
New aspects of nanopotentiometry for complementary metal-oxide-semiconductor transistors
Trenkler, Thomas; Stephenson, Robert; Jansen, Philippe; Vandervorst, Wilfried; Hellemans, L. (2000) -
New aspects of nanopotentiometry for MOSFET transistors
Trenkler, Thomas; Stephenson, Robert; Jansen, Philippe; Vandervorst, Wilfried; Hellemans, L. (1999) -
Non-destructive techniques for identification and control of processing induced extended defects in silicon and correlation with device yield
Vanhellemont, Jan; Milita, S.; Servidori, M.; Higgs, V.; Kissinger, G.; Gramenova, Emilia; Simoen, Eddy; Jansen, Philippe (1997) -
Non-destructive techniques for identification and control of processing induced extended defects in silicon and correlation with device yield
Vanhellemont, Jan; Servidori, M.; Higgs, V.; Gramenova, Emilia; Simoen, Eddy; Jansen, Philippe (1996) -
Practicalities and limitations of scanning capacitance microscopy for routine IC characterisation
Stephenson, Robert; De Wolf, Peter; Trenkler, Thomas; Hantschel, Thomas; Clarysse, Trudo; Jansen, Philippe; Vandervorst, Wilfried (1999) -
Practicalities and limitations of scanning capacitance microscopy for routine integrated circuit characterization
Stephenson, Robert; De Wolf, Peter; Trenkler, Thomas; Hantschel, Thomas; Clarysse, Trudo; Jansen, Philippe; Vandervorst, Wilfried (2000) -
Precision electrical trimming of very low TCR poly-SiGe resistors
Babcock, J. A.; Francis, P.; Bashir, R.; Kabir, A. E.; Schroder, D. K.; Lee, M.S.L.; Dhayagude, T.; Yindeepol, W.; Prasad, S. J.; Kalnitsky, A.; Thomas, M. E.; Haggag, H.; Egan, K.; Bergemont, A.; Jansen, Philippe (2000) -
RF ESD protection strategies - the design and performance trade-off challenges
Jansen, Philippe; Thijs, Steven; Linten, Dimitri; Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Liu, Mingxu; Concannon, A.; Tremouilles, David; Nakaie, T.; Sawada, M.; Vashchenko, V.; ter Beek, M.; Hasebe, T.; Decoutere, Stefaan; Groeseneken, Guido (2005-09) -
RFCMOS ESD protection and reliability
Mahadeva Iyer, Natarajan; Linten, Dimitri; Thijs, Steven; Jansen, Philippe; Tremouilles, David; Decoutere, Stefaan; Groeseneken, Guido (2005-06) -
SCCF - System to component level correlation factor
Thijs, Steven; Scholz, Mirko; Linten, Dimitri; Griffoni, Alessio; Russ, Christian; Stadler, Wolfgang; Lafonteese, David; Vashchenko, Vladislav; Sawada, Masanori; Concannon, Ann; Hopper, Peter; Jansen, Philippe; Groeseneken, Guido (2010) -
Self-protection capability of integrated power arrays
Vashchenko, Vladislav; Scholz, Mirko; Linten, Dimitri; Lafonteese, David; Thijs, Steven; Jansen, Philippe; Hopper, Peter; Groeseneken, Guido (2010) -
Snapback circuit model for cascaded NMOS ESD over-voltage protection structures
Vassilev, Vesselin; Lorenzini, Martino; Jansen, Philippe; Vashchenko, V.; Yang, J.J.; Concannon, A.; Archer, D.; Groeseneken, Guido; Mahadeva Iyer, Natarajan; Terbeek, M.; Thijs, Steven; Choi, B.J.; Steyaert, M.; Maes, Herman (2003-09) -
Substrate bonding techniques for CMOS processed wafers
van der Groen, Sonja; Rosmeulen, Maarten; Baert, Kris; Jansen, Philippe; Deferm, Ludo (1997) -
Substrate bonding techniques for CMOS processed wafers
van der Groen, Sonja; Rosmeulen, Maarten; Baert, Kris; Jansen, Philippe; Deferm, Ludo (1996) -
Techniques for substrate bonding
Baert, Kris; Deferm, Ludo; Jansen, Philippe; Rosmeulen, Maarten; van der Groen, Sonja (1996) -
Theoretical study of tunneling current in the access region of various heterojunction field-effect transistor structures
Jansen, Philippe; Mizuta, H.; Yamaguchi, K.; Wagner, M. (1996) -
Voltage overshoot study in 20V DeMOS-SCR devices
Vashchenko, Vladislav; Jansen, Philippe; Scholz, Mirko; Hopper, Peter; Sawada, Masanori; Nakaei, Toshiyuki; Hasebe, Takumi; Thijs, Steven (2007-09)