Browsing by author "Meuris, Marc"
Now showing items 61-80 of 502
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Calculation of the electron mobility in III-V inversion layers with high-kappa dielectrics
O'Regan, Terrance; Soree, Bart; Fischetti, Massimo; Jin, S.; Magnus, Wim; Meuris, Marc (2010) -
Capacitance-voltage (CV) characterization of GaAs-oxide interfaces
Brammertz, Guy; Martens, Koen; Lin, Dennis; Merckling, Clement; Penaud, Julien; Adelmann, Christoph; Sioncke, Sonja; Wang, Wei-E; Caymax, Matty; Meuris, Marc; Heyns, Marc (2008) -
Capacitance-voltage (CV) characterization of GaAs/high-k oxide interfaces
Brammertz, Guy; Lin, H.C.; Martens, Koen; Merckling, Clement; Penaud, J.; Alian, AliReza; Sioncke, Sonja; Wang, Wei-E; Meuris, Marc; Caymax, Matty; Heyns, Marc (2008) -
Capacitance-voltage (CV)characterization of GaAs-oxide interfaces
Brammertz, Guy; Lin, H.C.; Martens, Koen; Mercier, David; Merckling, Clement; Penaud, Julien; Adelmann, Christoph; Sioncke, Sonja; Wang, Wei-E; Caymax, Matty; Meuris, Marc; Heyns, Marc (2008) -
Capacitance-voltage characterization of GaAs-Al2O3 interfaces
Brammertz, Guy; Lin, Dennis; Martens, Koen; Mercier, David; Sioncke, Sonja; Delabie, Annelies; Wang, Wei-E; Caymax, Matty; Meuris, Marc; Heyns, Marc (2008) -
Capacitance-voltage characterization of GaAs-Oxide interfaces
Brammertz, Guy; Lin, Dennis; Martens, Koen; Mercier, David; Merckling, Clement; Penaud, Julien; Adelmann, Christoph; Sioncke, Sonja; Wang, Wei-E; Caymax, Matty; Meuris, Marc; Heyns, Marc (2008) -
Catalytic forming gas anneal on III-V/Ge MOS sytems
Wang, Wei-E; Lin, Han-Chung; Brammertz, Guy; Delabie, Annelies; Simoen, Eddy; Caymax, Matty; Meuris, Marc; Heyns, Marc (2009) -
Challenges for atomic layer deposition in CMOS devices with high-mobility channel materials
Delabie, Annelies; Alian, AliReza; Bellenger, Florence; Caymax, Matty; Conard, Thierry; Franquet, Alexis; Sioncke, Sonja; Vandervorst, Wilfried; Van Elshocht, Sven; Heyns, Marc; Meuris, Marc (2009) -
Challenges for introducing Ge and III/V devices into CMOS technologies
Heyns, Marc; Alian, AliReza; Brammertz, Guy; Caymax, Matty; Eneman, Geert; Franco, Jacopo; Gencarelli, Federica; Groeseneken, Guido; Hellings, Geert; Hikavyy, Andriy; Houssa, Michel; Kaczer, Ben; Lin, Dennis; Loo, Roger; Merckling, Clement; Meuris, Marc; Mitard, Jerome; Nyns, Laura; Sioncke, Sonja; Vandervorst, Wilfried; Vincent, Benjamin; Waldron, Niamh; Witters, Liesbeth (2012) -
Channel backscattering characteristics of high performance germanium pMOSFETs
Dobbie, Andrew; De Jaeger, Brice; Meuris, Marc; Whall, T.E; Leadley, D.R (2008) -
Characteristic trapping lifetime and capacitance-voltage measurements of GaAs metal-oxide-semiconductor structures
Brammertz, Guy; Martens, Koen; Sioncke, Sonja; Delabie, Annelies; Caymax, Matty; Meuris, Marc; Heyns, Marc (2007-09) -
Characterization of atomic-beam deposited GeO1-xNx/HfO2 stacks on Ge
Houssa, Michel; Conard, Thierry; Van Steenbergen, Jan; Mavrou, G.; Panayiotatos, Y.; dimoulas, A.; Meuris, Marc; Caymax, Matty; Heyns, Marc (2005) -
Characterization of defects in 9.7 % efficient Cu2ZnSnSe4-CdS-ZnO solar cells
Brammertz, Guy; Oueslati, Souhaib; ElAnzeery, Hossam; Ben Messaoud, Khaled; Sahayaraj, Sylvester; koeble, christine; Meuris, Marc; Poortmans, Jef (2013) -
Characterization of slurry system and suppression of oxide erosion in aluminun CMP (chemical-mechanical planarization)
Zhong, L.; Yang, G.; Holland, K.; Grillaert, Joost; Devriendt, Katia; Heylen, Nancy; Meuris, Marc (2000) -
Characterization of threading dislocations in thin germanium layers by defect etching: towards chromium and HF free solution
Souriau, Laurent; Atanasova, Tanya; Terzieva, Valentina; Moussa, Alain; Caymax, Matty; Loo, Roger; Meuris, Marc; Vandervorst, Wilfried (2008) -
Characterization of voltage and frequency dependent parasitics observed in Si passivated germanium metal gate pMOSFETs
Krom, Raymond; Mitard, Jerome; Plourde, Chelsea; De Jaeger, Brice; Meuris, Marc; Heyns, Marc (2008) -
Charge pumping characterization of germanium MOSFETs
Martens, Koen; Kaczer, Ben; De Jaeger, Brice; Meuris, Marc; Maes, Herman; Groeseneken, Guido (2007) -
Cleaning of metal contamination
Mertens, Paul; Hurd, Trace; Gräf, D.; Meuris, Marc; Schmidt, Harald; Heyns, Marc; Kwakman, L.; Hendriks, M.; Kubota, M. (1994) -
Cleaning technology for highly reliable gate oxides
Heyns, Marc; Meuris, Marc; Verhaverbeke, Steven; Mertens, Paul; Schmidt, Harald; Rotondaro, Antonio; Hurd, Trace; Hatcher, Z.; Gräf, D. (1994) -
Cleaning, rinsing and drying aspects in post-Cu-CMP clean
Fyen, Wim; Vos, Rita; Teerlinck, Ivo; Vrancken, Evi; Grillaert, Joost; Meuris, Marc; Heyns, Marc (1999)