Browsing by title

H-2 sensors based on WO3 thin films activated by platinum nanoparticles synthesized by electroless process

Zhang, Chao; Kanta, Abdoul-Fatah; Yin, Hong; Boudiba, Abdelhamid; D'Haen, Jan; Olivier, Marie-Georges; Debliquy, Marc (2013)

H-treatment impact on conductive-filament formation and stability in Ta2O5-based resistive-switching memory cells

Goux, Ludovic; Kim, J. Y.; Magyari-Kope, B.; Nishi, Y.; Redolfi, Augusto; Jurczak, Gosia (2015)

H2 generation by solar water splitting using nanostructured GaN electrode

Tseng, Peter; Lieten, Ruben; Vereecken, Philippe; Borghs, Gustaaf (2012)

H2/D2 isotopic effect on negative bias temperature instabilities in SiOx/HfSiON/TaN gate stacks

Houssa, Michel; Aoulaiche, Marc; Stesmans, Andre; De Gendt, Stefan; Groeseneken, Guido; Heyns, Marc (2005)

H2O and O3 based atomic layer deposition of high-k dielectric layers on high mobility substrates

Delabie, Annelies; Nyns, Laura; Alian, AliReza; Bellenger, Florence; Conard, Thierry; Franquet, Alexis; Sioncke, Sonja; Van Elshocht, Sven; Heyns, Marc; Meuris, Marc; Caymax, Matty (2009)

H2O- and O3-based atomic layer deposition of high-K dielectric films on GeO2 passivation layers

Delabie, Annelies; Alian, AliReza; Bellenger, Florence; Caymax, Matty; Conard, Thierry; Franquet, Alexis; Sioncke, Sonja; Van Elshocht, Sven; Heyns, Marc; Meuris, Marc (2009)

H2O2 decomposition and its impact on silicon surface roughening and gate oxide integrity

Schmidt, Harald; Meuris, Marc; Rotondaro, Antonio; Heyns, Marc; Hurd, Trace; Hatcher, Z. (1995)

H2S exposure of a (100)Ge surfaces: evidences for a (2x1) electrically passivated surface

Houssa, Michel; Nelis, Daniel; Hellin, David; Pourtois, Geoffrey; Conard, Thierry; Paredis, K.; Vanormelingen, Koen; Vantomme, Andre; Van Bael, Marlies; Mullens, J.; Caymax, Matty; Meuris, Marc; Heyns, Marc (2007)

H2S molecular beam passivation of Ge(001)

Merckling, Clement; Chang, Yao-Chung; Lu, Chung-Yu; Penaud, Julien; El-Kazzi, Mario; Bellenger, Florence; Brammertz, Guy; Hong, Minghwei; Kwo, Raynien; Meuris, Marc; Dekoster, Johan; Heyns, Marc; Caymax, Matty (2011)

HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale

Jannis, D.; Guzzinati, G.; Beche, A.; Verbeeck, J.; Prabhakara, Viveksharma; Bender, Hugo (2020)

Hadamard speckle contrast reduction for imaging system: comprehension and evaluation

Qi, Feng; Tavakol, V.; Ocket, Ilja; Islam, S.; Schreurs, Dominique; Nauwelaers, Bart; Jager, I.; Stiens, J. (2009)

Hadoop-Based Solutions for Variant Calling and Variant Analysis

Decap, Dries (2017-06)

Haematopoietic prolyl hydroxylase-1 deficiency promotes M2 macrophage polarization and is both necessary and sufficient to protect against experimental colitis

Van Welden, Sophie; De Vos, Martine; Wielockx, Ben; Tavernier, Simon; Dullaers, Melissa; Neyt, Sara; Descamps, Benedicte; Devisscher, Lindsey; Devriese, Sarah; Van den Bossche, Lien; Holvoet, Tom; Baeyens, Ann; Correale, Carmen; D'Alessio, Silvio; Vanhove, Christian; De Vos, Filip; Verhasselt, Bruno; Breier, Georg; Lambrecht, Bart; Janssens, Sophie; Carmeliet, Peter; Danese, Silvio; Elewaut, Dirk; Laukens, Debby; Hindryckx, Pieter (2017)

Hafnium aluminates deposited by atomic layer deposition: Structural characterization by X-ray spectroscopy

Huanca, D.R.; Christiano, V.; Adelmann, Christoph; Kellerman, G.; Verdonck, Patrick; dos Santos Filho, S. (2012)

Hafnium oxide based CMOS compatible ferroelectric materials

Schroeder, Uwe; Martin, D.; Mueller, J.; Yurchuk, E.; Mueller, S.; Adelmann, Christoph; Schloesser, T.; van Bentum, R.; Mikolajick, Thomas (2012)

Hafnium oxide films by atomic layer deposition for high-k gate dielectric applications: analysis of the density of nanometer-thin films

Puurunen, Riikka; Delabie, Annelies; Van Elshocht, Sven; Caymax, Matty; Green, Martin; Brijs, Bert; Richard, Olivier; Bender, Hugo; Conard, Thierry; Hoflijk, Ilse; Vandervorst, Wilfried; Hellin, David; Vanhaeren, Danielle; Zhao, Chao; De Gendt, Stefan; Heyns, Marc (2005)