Browsing by subject "1/F NOISE"

DC and low a frequency noise analysis of p channel gate all around vertically stacked silicon nanosheets

Cretu, B.; Veloso, Anabela; Simoen, Eddy (2022)

Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs

Li, Kan; Zhang, En Xia; Gorchichko, Mariia; Wang, Peng Fei; Reaz, Mahmud; Zhao, Simeng E.; Hiblot, Gaspard; Van Huylenbroeck, Stefaan; Jourdain, Anne; Alles, Michael L.; Reed, Robert A.; Fleetwood, Daniel M.; Schrimpf, Ronald D. (2021)

In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets

Cretu, B.; Veloso, Anabela; Simoen, Eddy (2023)

Low-Frequency Noise and Border Traps in Irradiated nMOS and pMOS Bulk Si FinFETs With SiO2/HfO2 Gate Dielectrics

Li, Kan; Luo, Xuyi; Rony, M. W.; Gorchichko, Mariia; Hiblot, Gaspard; Van Huylenbroeck, Stefaan; Jourdain, Anne; Alles, Michael L.; Reed, Robert A.; Zhang, En Xia; Fleetwood, Daniel M.; Schrimpf, Ronald D. (2023)

Low-Frequency noise investigation of AlGaN/GaN high-electron-mobility transistors

Andrade, Maria Gloria Cano de; Bergamim, Luis Felipe de Oliveira; Baptista Junior, Braz; Nogueira, Carlos Roberto; da Silva, Fabio Alex; Takakura, Kenichiro; Parvais, Bertrand; Simoen, Eddy (2021)

Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation

Lee, Kookjin; Nam, Sangjin; Ji, Hyunjin; Choi, Junhee; Jin, Jun-Eon; Kim, Yeonsu; Na, Junhong; Ryu, Min-Yeul; Cho, Young-Hoon; Lee, Hyebin; Lee, Jaewoo; Joo, Min-Kyu; Kim, Gyu-Tae (2021)

Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs

Luo, Xuyi; Zhang, En Xia; Wang, Peng Fei; Li, Kan; Linten, Dimitri; Mitard, Jerome; Reed, Robert A.; Fleetwood, Daniel M.; Schrimpf, Ronald D. (2023)

Negative-Bias-Stress and Total-Ionizing-Dose Effects in Deeply Scaled Ge-GAA Nanowire pFETs

Rony, M. W.; Zhang, En Xia; Toguchi, Shintaro; Luo, Xuyi; Reaz, Mahmud; Li, Kan; Linten, Dimitri; Mitard, Jerome; Reed, Robert A.; Fleetwood, Daniel M.; Schrimpf, Ronald D. (2022)

Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs

Cretu, Bogdan; Veloso, Anabela; Simoen, Eddy (2023)