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TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses
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Authors
Bonaldo, Stefano
;
Gorchichko, Mariia
;
Zhang, En Xia
;
Ma, Teng
;
Mattiazzo, Serena
;
Bagatin, Marta
;
Paccagnella, Alessandro
;
Gerardin, Simone
;
Schrimpf, Ronald D.
;
Reed, Robert A.
;
Linten, Dimitri
;
Mitard, Jerome
;
Fleetwood, Daniel M.
DOI
10.1109/TNS.2022.3142385
ISSN
0018-9499
Issue
7
Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume
69
Title
TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses
Publication type
Journal article
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2
20.500.12860/40187.2
*
2022-11-25T09:32:03Z
validation by library/open access desk
1
20.500.12860/40187
2022-07-31T02:29:16Z
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