Toggle navigation
My submissions
Login
Toggle navigation
View item
imec Publications Repository
imec Publications
Articles
View item
imec Publications Repository
imec Publications
Articles
View item
JavaScript is disabled for your browser. Some features of this site may not work without it.
Total-Ionizing-Dose Response of Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors
Metadata
Show full item record
Authors
Gorchichko, Mariia
;
Zhang, En Xia
;
Wang, Pan
;
Bonaldo, Stefano
;
Schrimpf, Ronald D.
;
Reed, Robert A.
;
Linten, Dimitri
;
Mitard, Jerome
;
Fleetwood, Daniel M.
DOI
10.1109/TNS.2021.3066612
ISSN
0018-9499
Issue
5
Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume
68
Title
Total-Ionizing-Dose Response of Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors
Publication type
Journal article
Collections
Articles
Version history
Version
Item
Date
Summary
3
20.500.12860/37952.3
*
2022-03-31T12:20:17Z
validation by library/open access desk
2
20.500.12860/37952.2
2022-03-24T10:38:35Z
validation by imec author
1
20.500.12860/37952
2021-11-02T16:01:59Z
*Selected version
Search imec Publications Repository
This collection
Browse
All of imec Publications Repository
Collections
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
This collection
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
My account
login