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In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets
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Authors
Cretu, B.
;
Veloso, Anabela
;
Simoen, Eddy
DOI
10.1016/j.sse.2023.108591
ISSN
0038-1101
Issue
March
Journal
SOLID-STATE ELECTRONICS
Volume
201
Title
In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets
Publication type
Journal article
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2
20.500.12860/41711.2
*
2023-07-03T12:36:09Z
validation by library/open access desk
1
20.500.12860/41711
2023-06-11T19:49:45Z
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