Browsing by author "Cretu, B."
Now showing items 1-20 of 23
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Assessment of temperature dependence of the low frequency noise in unstrained and strained FinFETs
Talmat, R.; Achour, H.; Cretu, B.; Routoure, J.-M.; Benfdila, A.; Carin, R.; Collaert, Nadine; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2011) -
DC and low a frequency noise analysis of p channel gate all around vertically stacked silicon nanosheets
Cretu, B.; Veloso, Anabela; Simoen, Eddy (2022) -
DC and noise performances of SOI FinFETs at very low temperature
Achour, H.; Talmat, R.; Cretu, B.; Routoure, J.M.; Benfdila, A.; Carin, R.; Collaert, Nadine; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2012) -
Detailed low frequency noise assessment on GAA NW n-channel FETs
Cretu, B.; Bordin, A.; Claeys, C.; Simoen, Eddy; Hellings, Geert; Linten, Dimitri (2021) -
High-temperature characterization of advanced strained nMUGFETs
Talmat, Rachida; Put, Sofie; Collaert, Nadine; Mercha, Abdelkarim; Claeys, Cor; Guo, W.; Cretu, B.; Benfdila, A.; Routoure, J.-M.; Carin, R.; Simoen, Eddy (2010) -
Identification de niveaux pièges dans les oxydes de transistors MOS par des mesures de bruit basse-fréquence à différentes températures
Routoure, J.M.; Guo, W.; Cretu, B.; Lartigau, I.; Carin, R.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2008) -
Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy
Achour, H.; Cretu, B.; Simoen, Eddy; Routoure, J.M.; Carin, R.; Benfdila, A.; Aoulaiche, Marc; Claeys, Cor (2015) -
Impact of cryogenic temperature operation on static and low frequency noise behaviors of FD UTBOX nMOSFETs
Nafaa, B.; Cretu, B.; Ismail, N.; Touayar, O.; Simoen, Eddy (2017) -
Impact of strain and source/drain engineering on the low-frequency noise behaviour in n-channel Tri-Gate FinFETs
Guo, Wei; Cretu, B.; Routoure, J.-M.; Carin, R.; Simoen, Eddy; Mercha, Abdelkarim; Collaert, Nadine; Put, Sofie; Claeys, Cor (2008) -
In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets
Cretu, B.; Veloso, Anabela; Simoen, Eddy (2023) -
Is there a limit when the access resistance impact on the extraction of key GAA NS FETs devices parameters can (not) be avoided?
Tahiat, A.; Cretu, B.; Veloso, Anabela; Simoen, E. (2023) -
Low frequency noise characterization in n-channel FinFETs
Talmat, R.; Achour, H.; Cretu, B.; Routoure, J.-M.; Benfdila, A.; Carin, R.; Collaert, Nadine; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2012) -
Low frequency noise spectroscopy in advanced nFinFETs
Talmat, R.; Achour, H.; Cretu, B.; Routoure, J.M.; Benfdila, A.; Carin, R.; Collaert, Nadine; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2011) -
Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator metal-oxide-semiconductor field effect transistors
Lartigau, I.; Routoure, J.M.; Guo, W.; Cretu, B.; Carin, R.; Mercha, Abdelkarim; Claeys, Cor; Simoen, Eddy (2007) -
Low-frequency noise assessment of silicon passivated Ge pMOSFETs with TiN/TaN/HfO2 gate stack
Guo, Wei; Nicholas, Gareth; Kaczer, Ben; Todi, Ravi; De Jaeger, Brice; Claeys, Cor; Mercha, Abdelkarim; Simoen, Eddy; Cretu, B.; Routoure, J.M.; Carin, R. (2007) -
Low-frequency noise behavior at low temperature (80K-300K) of silicon passivated Ge pMOSFETs with high-K metal gate stack
Guo, W.; Cretu, B.; Routoure, J.M.; Carin, R.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2007) -
Low-frequency noise behavior in p-channel SOI FinFETs processed with different strain techniques
Guo, W.; Talmat, R.; Cretu, B.; Routoure, J.M.; Carin, R.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2009) -
Novel Y-function based strategy for parameter extraction in S/D asymmetric architecture devices and low frequency noise characterization in GAA Si VNW pMOSFETs
Tahiat, A.; Cretu, B.; Veloso, Anabela; Simoen, Eddy (2023) -
Secondary impact ionization and device aging in deep submicron MOS devices with various transistor architectures
Marchand, B.; Cretu, B.; Ghibaudo, G.; Balestra, F.; Blachier, D.; Leroux, C.; Deleonibus, S.; Guegan, G.; Reimbold, G.; Kubicek, Stefan; De Meyer, Kristin (2002) -
Static and low frequency noise characterization in standard and rotated UTBOX nMOSFETs
Cretu, B.; Simoen, Eddy; Routoure, J.M.; Carin, R.; Aoulaiche, Marc; Claeys, Cor (2015)