Publication:
Contactless mobility measurements of inversion charge carriers on silicon substrates with SiO2 and HfO2 gate dielectrics
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Acq. date: 2026-10-10
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1 since deposited on 2021-10-18
Acq. date: 2026-10-10
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1941 since deposited on 2021-10-18
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Acq. date: 2026-10-10
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