Publication:
Understanding the intrinsic reliability behavior of n-/p-Si and p-Ge nanowire FETs utilizing degradation maps
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Downloads
2 since deposited on 2021-10-26
Acq. date: 2025-12-16
Views
1868 since deposited on 2021-10-26
2last month
Acq. date: 2025-12-16
Citations
Metrics
Downloads
2 since deposited on 2021-10-26
Acq. date: 2025-12-16
Views
1868 since deposited on 2021-10-26
2last month
Acq. date: 2025-12-16
Citations