Publication:

Deep traps in In0.3Ga0.7As nFinFETs, studied by generation-recombination noise

Date

2017

Proceedings Paper

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Files

35501.pdf 7.48 MB

Author(s)

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Kunert, Bernardette

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Collaert, Nadine

Statistics

1983 since deposited on 2021-10-24

Acq. date: 2026-04-23