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Recess metrology challenges for 3D device architectures in advanced technology nodes
Publication:
Recess metrology challenges for 3D device architectures in advanced technology nodes
Date
2022
Proceedings Paper
https://doi.org/10.1117/12.2613771
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Santoro, Gaetano
;
Houchens, Kevin
;
Bogdanowicz, Janusz
;
Elizov, Moshe
;
Yaron, Lior
;
Chemama, Michael
;
Goldenshtein, Alex
;
Zakay, Amit
;
Amit, Noam
;
Briggs, Basoene
;
Pacco, Antoine
;
Delhougne, Romain
;
Cockburn, Andrew
;
Abramovitz, Yaniv
;
Tam, Aviram
;
Adan, Ofer
;
Mertens, Hans
;
Charley, Anne-Laure
;
Horiguchi, Naoto
;
Leray, Philippe
;
Lorusso, Gian
Journal
Proceedings of SPIE
Abstract
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Downloads
435
since deposited on 2022-09-08
Acq. date: 2025-10-23
Views
1390
since deposited on 2022-09-08
Acq. date: 2025-10-23
Citations
Metrics
Downloads
435
since deposited on 2022-09-08
Acq. date: 2025-10-23
Views
1390
since deposited on 2022-09-08
Acq. date: 2025-10-23
Citations