Publication:
Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs
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Acq. date: 2026-03-17
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Acq. date: 2026-03-17
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2 since deposited on 2023-01-01
Acq. date: 2026-03-17
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1358 since deposited on 2023-01-01
Acq. date: 2026-03-17
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