Publication:

Toward understanding positive bias temperature instability in fully recessed-gate GaN MISFETs

Date

2016

Journal article

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Author(s)

;

;

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De Jaeger, Brice

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Bakeroot, Benoit

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Stoffels, Steve

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Van Hove, Marleen

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Groeseneken, Guido

;

Decoutere, Stefaan

Journal

IEEE Transactions on Electron Devices

Statistics

1814 since deposited on 2021-10-23

Acq. date: 2026-07-16